View FXLS8471Q_8900485.PDF datasheet online --- IC-ON-LINE

Datasheet File OCR Text:

freescale reserves the right to change the deta il specifications as may be required to permit improvements in the design of its products. freescale semiconductor document number: FXLS8471Q data sheet: technical data rev. 1.5, 06/2015 an energy-efficient solution by freescale ? 2013-2015 freescale semiconducto r, inc. all ri ghts reserved. FXLS8471Q, 3-axis, linear accelerometer FXLS8471Q is a small, low-power, 3-axis, linear accelerometer in a 3 mm x 3 mm x 1 mm qfn package. FXLS8471Q has dynamically selectable acceleration full-scale ranges of 2 g /4 g /8 g and 14 bits of resolution. output data rates (odr) are programmable from 1.563 hz to 800 hz. i 2 c and spi serial digital interfaces are provided along with several user programmable event detection functions th at can be used to reduce the overall system power consumption by off-loading the host processor. FXLS8471Q is guaranteed to operate over the extend ed temperature range of -40 c to +85 c. features ? 1.95 v to 3.6 v vdd supply voltage, 1.62 v to 3.6 v vddio voltage ?2 g /4 g /8 g dynamically selectable acceleration full-scale ranges ? output data rates (odr) from 1.563 hz to 800 hz ? low noise: typically 99 g/hz in low-noise mode @ 200-hz bandwidth ? 14-bit adc resolution: 0.244 mg/lsb in 2 g, full-scale range ? embedded programmable acceleration event functions: ? freefall and motion detection ? transient detection ? vector-magnitude change detection ? pulse and tap detection (single and double) ? orientation detection (portrait/landscape) ? programmable automatic odr change using auto-wake and return to sleep functions to save power. ? 192-byte fifo buffer, capable of storing up to 32 samples of x/y/z data ? supports 4-wire spi interface at up to 1 mhz; i 2 c normal (100 khz) and fast modes (400 khz) ? integrated accelerome ter self-test function target markets ? industrial applications: vibration analysis, machine health monitoring, and platform stabilization ? smartphones, tablets, digital cameras, and personal navigation devices ? medical applications: patient monitoring, fall detection, and rehabilitation applications ? shock and vibration monitoring (mechatronic compensation, shipping, and warranty usage logging) ? user interface (menu scrolling by orientatio n change, tap detection for button replacement) ? orientation detection (portrait/landscape: up/dow n, left/right, back/front position identification) ? gaming and real-time activity analysis (pedometry, freefall and drop detection for hard disk drives and other devices) ? power management for mobile devic es using inertial event detection 1 vddio 6 2 3 4 5 13 12 11 10 9 78 16 15 14 byp reserved scl/sclk gnd reserved gnd int1 sa1/cs_b int2 sda/mosi sa0/miso rst n/c vdd 16 lead qfn 3 mm x 3 mm x 1 mm FXLS8471Q top view pin connections FXLS8471Q f x l s 8 4 7 1 q n/c
FXLS8471Q sensors 2 freescale semiconductor, inc. related documentation the FXLS8471Q device featur es and operations are described in a variety of reference manuals, user guides, and application notes. to find the most-current versions of these documents: 1. go to the freescale homepage at: http://www.freescale.com/ 2. in the keyword search box at the top of the page, enter the device number FXLS8471Q. in the refine your result pane on the left, click on the documentation link. ordering information part number temperature range package description shipping FXLS8471Qr1 -40c to +85c qfn-16 tape and reel (1 k)
FXLS8471Q sensors freescale semiconductor, inc. 3 contents 1 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 2 pin description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 2.1 soldering information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 2.2 orientation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 3 example FXLS8471Q driver code. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 3.1 introduction. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 3.2 FXLS8471Q addresses . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 3.3 sensor data structure . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 3.4 FXLS8471Q configuration function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10 3.5 FXLS8471Q data read function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11 4 terminology . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.1 sensitivity . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.2 zero-g offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4.3 self-test . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 5 device characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5.1 mechanical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5.2 electrical characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 5.3 absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 6 digital interfaces. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 6.1 i 2 c interface characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16 6.1.1 general i 2 c operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 6.1.2 i 2 c read/write operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17 6.2 spi interface characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 6.2.1 general spi operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 6.2.2 spi read/write operations . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 6.2.3 i 2 c/spi auto detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 6.2.4 power supply sequencing and i 2 c/spi mode auto-detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 7 modes of operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21 8 embedded functionality . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 8.1 factory calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 8.2 8-bit or 14-bit data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 8.3 low-power modes versus high-resolution modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22 8.4 auto-wake/sleep mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 8.5 freefall and motion event detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 8.5.1 freefall detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 8.5.2 motion detection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 8.6 transient detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 8.7 pulse detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 8.8 orientation detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 8.9 acceleration vector-magnitude detection. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24 9 register map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25 10 registers by functional blocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 10.1 device configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 10.1.1 status (0x00) register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 10.1.2 dr_status (0x00) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28 10.1.3 f_status (0x00) register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29 10.1.4 trig_cfg (0x0a) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 10.1.5 sysmod (0x0b) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 10.1.6 int_source (0x0c) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31 10.1.7 who_am_i (0x0d) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 10.1.8 ctrl_reg1 (0x2a) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 10.1.9 ctrl_reg2 (0x2b) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33 10.1.10 ctrl_reg3 [interrupt contro l register] (0x2c) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 10.1.11 ctrl_reg4 [interrupt enable register ] (0x2d) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36 10.1.12 ctrl_reg5 [interrupt rout ing configuration register] (0x2e) register. . . . . . . . . . . . . . . . . . . . . . . . . . 37 10.2 auto-sleep trigger. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 10.2.1 aslp_count (0x29) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39 10.3 output data registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 10.3.1 out_x_msb (0x01), out_x_lsb (0x02), out_y_msb (0x03), out_y_lsb (0x04), out_z_msb (0x05), out_z_lsb (0x06) registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41 10.4 fifo . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 10.4.1 f_setup (0x09) register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42 10.5 sensor data configuration. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
FXLS8471Q sensors 4 freescale semiconductor, inc. 10.5.1 xyz_data_cfg (0x0e) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 10.6 high-pass filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 10.6.1 hp_filter_cutoff (0x0f) register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43 10.7 portrait/landscape detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45 10.7.1 pl_status (0x10) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 46 10.7.2 pl_cfg (0x11) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 10.7.3 pl_count (0x12) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47 10.7.4 pl_bf_zcomp (0x13) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48 10.7.5 pl_ths_reg (0x14) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49 10.8 freefall and motion detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 49 10.8.1 a_ffmt_cfg (0x15) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 10.8.2 a_ffmt_src (0x16) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 51 10.8.3 a_ffmt_ths (0x17), a_ffmt_ ths_x_ msb (0x73), a_ffmt_ths_x_lsb (0x74), a_ffmt_ths_y_msb (0x75), a_ffmt_ths_y_lsb (0x76), a_ffmt_ths_z_msb (0x77), a_ffmt_ths_z_lsb (0x78) registers . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 52 10.8.4 a_ffmt_count (0x18) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 53 10.9 accelerometer vector-magnitude function . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 10.9.1 a_vecm_cfg (0x5f) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 55 10.9.2 a_vecm_ths_msb (0x60) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 10.9.3 a_vecm_ths_lsb (0x61) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 10.9.4 a_vecm_cnt (0x62) register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 56 10.9.5 a_vecm_initx_msb (0x63) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 10.9.6 a_vecm_initx_lsb (0x64) re gister . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 10.9.7 a_vecm_inity_msb (0x65) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 10.9.8 a_vecm_inity_lsb (0x66) re gister . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 10.9.9 a_vecm_initz_msb (0x67) re gister . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 57 10.9.10 a_vecm_initz_lsb (0x68) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 10.10 transient (ac) acceleration detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 10.10.1 transient_cfg (0x1d) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 58 10.10.2 transient_src (0x1e) register. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59 10.10.3 transient_ths (0x1f) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 10.10.4 transient_count (0x20) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 10.11 pulse detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61 10.11.1 pulse_cfg (0x21) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 61 10.11.2 pulse_src (0x22) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62 10.11.3 pulse_thsx (0x23) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 62 10.11.4 pulse_thsy (0x24) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63 10.11.5 pulse_thsz (0x25) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63 10.11.6 pulse_tmlt (0x26) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 63 10.11.7 pulse_ltcy (0x27) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 64 10.11. 8 pulse_wind (0x28) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 10.12 offset correction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 10.12.1 off_x (0x2f) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 10.12.2 off_y (0x30) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 10.12.3 off_z (0x31) register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 66 11 mounting guidelines for the quad flat no-lead (qfn) package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 11.1 overview of soldering considerations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 11.2 halogen content . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 11.3 pcb mounting recommendations. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 67 12 package thermal characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 69 13 package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 70 appendix a . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73 a.1 errata . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 73 a.1.1 spi mode soft-reset using ctrl_reg2 (0x2b), bit 6 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .73 14 revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
FXLS8471Q sensors freescale semiconductor, inc. 5 1 block diagram figure 1. block diagram
FXLS8471Q sensors 6 freescale semiconductor, inc. 2 pin description figure 2. pinout diagram device power is supplied through the vdd pin. power-supply, decoupling capacitors (100 nf ceramic plus 4.7 f or larger bulk) should be placed as close as possible to pin 14 of the device. the digital interface supply voltage (vddio) must also be decoupled with a 100 nf ceramic capacitor placed as close as possible to pin 1 of the device. the digital control signals scl, sda, sa0, sa1, and rst are not tolerant of voltages more than vddio + 0.3 v. if vddio is removed, these pins will clamp any logic signals through their internal esd protection diodes. table 1. pin description pin name function 1 vddio interface power supply 2 byp internal regulator output bypass capacitor connection 3 reserved test reserved, connect to gnd 4s c l / s c l ki 2 c serial clock/spi clock 5 gnd ground 6sda/mosii 2 c serial data/spi master out, slave in 7 sa0/miso (1) 1. the sa0 pin is also used to select the desired serial inte rface mode during por and also after a hard/soft reset event. pleas e see section 6.2.3, ?i 2 c/spi auto detection? for more information i 2 c address selection bit 0/spi master in, slave out 8 n/c internally not connected 9 int2 interrupt 2 10 sa1/cs_b i 2 c address selection bit 1 (2) /spi chip select (active low) 2. see table 8 for i 2 c address options selectable using the sa0 and sa1 pins. 11 int1 interrupt 1 12 gnd ground 13 reserved test reserved, connect to gnd 14 vdd power supply 15 n/c internally not connected 16 rst reset input, active hi gh. connect to gnd if unused 1 vddio 6 2 3 4 5 13 12 11 10 9 78 16 15 14 byp reserved scl/sclk gnd reserved gnd int1 sa1/cs_b int2 sda/mosi sa0/miso n/c rst n/c vdd top view 16 lead qfn-col 3 mm x 3 mm x 1 mm FXLS8471Q
FXLS8471Q sensors freescale semiconductor, inc. 7 the function and timing of the two interrupt pins (int1 and int2) are user-programmable through the i 2 c/spi interface. the sda and scl i 2 c connections are open drain and therefore require a pullup resistor as shown in the application diagram in figure 3 . the int1 and int2 pins may also be configured for open-drain oper ation. if they are configured fo r open drain, external pullup resistors are required. figure 3. electr ical connection 2.1 soldering information the qfn package is compliant with the rohs standards. pleas e refer to freescale application note an4077 for more information. vddio int1 int2 sda/mosi sa0/miso rst vdd 0.1 f 0.1 f 4.7 f scl/sclk vddio vddio vddio vddio (connect to gnd if unused) note: pullup resistors on int1 and int2 are not required if these pins are configured for push/pull (default) operation. 0.1 f note: pullup resistors on scl/sclk and sda/mosi are not required if the device is operated in spi interface mode. 1 6 2 3 4 5 13 12 11 10 9 78 16 15 14 byp scl/sclk gnd reserved gnd sda/mosi sa0/miso n/c rst n/c vdd reserved vddio int1 int2 FXLS8471Q sa1/cs_b
FXLS8471Q sensors 8 freescale semiconductor, inc. 2.2 orientation figure 4. component axes orientation and response to gravity stimulus top view pin 1 side view top bottom +x +y +z 1 top view xout @ 0g earth gravity yout @ -1g zout @ 0g xout @ 1g yout @ 0g zout @ 0g xout @ -1g yout @ 0g zout @ 0g xout @ 0g yout @ 1g zout @ 0g xout @ 0g yout @ 0g zout @ 1g xout @ 0g yout @ 0g zout @ -1g
FXLS8471Q sensors freescale semiconductor, inc. 9 3 example fxls8 471q driver code 3.1 introduction it is very straightforward to configure the FXLS8471Q and start receiving data from the three accelerometerchannels. unfortunately, since every hardware platform will be different, it is not possible to provide completely portable software driv ers. this section therefore provides real FXLS8471Q driver co de for a kinetis uc board running under the mqx operating system. the i 2 c functions s_i2c_read_regs and s_i2c_write_regs are not prov ided here and should be replaced with the corresponding low level i 2 c driver code on the development platform. 3.2 FXLS8471Q addresses this section lists the i 2 c address of the FXLS8471Q. the i 2 c address depends on the logic level of FXLS8471Q pins sa0 and sa1 so the i 2 c address may be 0x1c, 0x1d, 0x1e or 0x1f. example 1. // FXLS8471Q i2c address #define FXLS8471Q_slave_addr 0x1e // with pins sa0=0, sa1=0 some of the key FXLS8471Q internal register addresses are listed below. example 2. // FXLS8471Q internal register addresses #define FXLS8471Q_status 0x00 #define FXLS8471Q_whoami 0x0d #define FXLS8471Q_xyz_data_cfg 0x0e #define FXLS8471Q_ctrl_reg1 0x2a #define FXLS8471Q_whoami_val 0x6a the reference driver here does a block read of the fxls84 71q status byte plus three 16-bit accelerometer channels. example 3. // number of bytes to be read from FXLS8471Q #define FXLS8471Q_read_len 7// status plus 3 accelerometer channels 3.3 sensor data structure the high and low bytes of the three accelerometer are placed in to a structure of type srawdata containing three signed short integers. example 4. typedef struct { int16_t x; int16_t y; int16_t z; } srawdata;
FXLS8471Q sensors 10 freescale semiconductor, inc. 3.4 FXLS8471Q confi guration function this function configures the FXLS8471Q for a 200-hz odr . the code is self-explanatory and can be easily customized for different settings. example 5. // function configures FXLS8471Q accelerometer sensor static _mqx_int s_FXLS8471Q_start(mqx_file_ptr afp) { uint8_t databyte; // read and check the FXLS8471Q whoami register if (s_i2c_read_regs(afp, FXLS8471Q_slave_addr, FXLS8471Q_whoami, &databyte, (uint8_t) 1) != 1) { return (i2c_error); } if (databyte != FXLS8471Q_whoami_val) { return (i2c_error); } // write 0000 0000 = 0x00 to accelerometer control register 1 to place FXLS8471Q into // standby // [7-1] = 0000 000 // [0]: active=0 databyte = 0x00; if (s_i2c_write_regs(afp, FXLS8471Q_slave_addr, FXLS8471Q_ctrl_reg1, &databyte, (uint8_t) 1) != 1) { return (i2c_error); } // write 0000 0001= 0x01 to xyz_data_cfg register // [7]: reserved // [6]: reserved // [5]: reserved // [4]: hpf_out=0 // [3]: reserved // [2]: reserved // [1-0]: fs=01 for accelerometer range of +/-4g with 0.488mg/lsb databyte = 0x01; if (s_i2c_write_regs(afp, FXLS8471Q_slave_addr, FXLS8471Q_xyz_data_cfg, &databyte, (uint8_t) 1) != 1) { return (i2c_error); } // write 0001 0101b = 0x15 to accelerometer control register 1 // [7-6]: aslp_rate=00 // [5-3]: dr=010 for 200hz data rate // [2]: lnoise=1 for low noise mode // [1]: f_read=0 for normal 16 bit reads // [0]: active=1 to take the part out of standby and enable sampling databyte = 0x15; if (s_i2c_write_regs(afp, FXLS8471Q_slave_addr, FXLS8471Q_ctrl_reg1, &databyte, (uint8_t) 1) != 1)
FXLS8471Q sensors freescale semiconductor, inc. 11 { return (i2c_error); } // normal return return (i2c_ok); } 3.5 FXLS8471Q data read function this function performs a block read of the status and acceleration data and places the bytes read into the structures of type srawdata as signed short integers. example 6. // read status and the three channels of accelerometer data from // FXLS8471Q (7 bytes) int16_t readaccel(srawdata *pacceldata) { mqx_file_ptr fp; // i2c file pointer uint8_t buffer[FXLS8471Q_read_len]; // read buffer // read FXLS8471Q_read_len=7 bytes (status byte and the three channels of data) if (s_i2c_read_regs(fp, FXLS8471Q_slave_addr, FXLS8471Q_status, buffer, FXLS8471Q_read_len) == FXLS8471Q_read_len) { // copy the 14 bit accelerometer byte data into 16 bit words pacceldata->x = ((buffer[1] << 8) | buffer[2])>> 2; pacceldata->y = ((buffer[3] << 8) | buffer[4])>> 2; pacceldata->z = ((buffer[5] << 8) | buffer[6])>> 2; } else { // return with error return (i2c_error); } // normal return return (i2c_ok); }
FXLS8471Q sensors 12 freescale semiconductor, inc. 4 terminology 4.1 sensitivity the sensitivity is repres ented in lsb/g. in 2- g mode the sensitivity is 4096 lsb/g. in 4- g mode the sensitivity is 2048 lsb/ g and in 8-g mode the sensitivity is 1024 lsb/g. 4.2 zero-g offset zero-g offset describes the deviation of an actual output signal from the ideal output signal if the sensor is stationary. a se nsor stationary on a horizontal surface will measure 0 g in x-axis and 0 g in y-axis whereas the z-axis will measure 1 g . a deviation from ideal value in this case is called zero- g offset. offset is to some extent a result of stress on the mems sensor and therefore the offset can slightly change after mounting the sensor onto a pr inted circuit board or exposing it to extensive mechanical stress . 4.3 self-test self-test can be used to verify the transducer functionality witho ut applying an external mechanical stimulus. when self-test i s activated, an electrostatic actuation force is applied to the sensor, simulating a small acceleration. in this case, the sensor outputs will exhibit a change in their dc levels which are related to the selected full scale through the device sensitivity. when self -test is activated, the device output level is given by the algebraic sum of the signals produced by the acceleration acting on the sens or and by the electrostatic self-test force.
FXLS8471Q sensors freescale semiconductor, inc. 13 5 device characteristics 5.1 mechanical characteristics table 2. mechanical characteristics @ vdd = 2.5 v , vddio = 1.8 v t = 25c unless otherwise noted . parameter test conditions symbol min typ max unit measurement range (1) 1. dynamic range is limited to 4 g when in the low-noise mode. 2 g mode fs acc 2 g 4 g mode 4 8 g mode 8 sensitivity 2 g mode sen acc 4096 lsb/ g 0.244 mg/lsb 4 g mode 2048 lsb/ g 0.488 mg/lsb 8 g mode 1024 lsb/ g 0.976 mg/lsb sensitivity change with temperature (1) 2 g, 4 g , 8 g modes tcs acc 0.01 %/c sensitivity accuracy @ 25c sen-tol acc 2.5 %sen acc zero- g level offset accuracy (2) 2. before board mount. 2 g, 4 g , 8 g modes off acc 20 mg zero- g level offset accuracy post-board mount (3) 3. post-board mount offset specificat ions are based on a 2-layer pcb design. 2 g, 4 g , 8 g modes off-pbm acc 30 mg zero- g level change versus temperature -40c to 85c (1) tco acc 0.2 mg/c nonlinearity (deviation from straight line) (4)(5) 4. evaluation only. 5. after post-board mount corrections for sensitivity, cro ss axis and offset. refer to an4399 for more information. over 1 g range normal mode nl acc 0.5 %fs acc self-test output change (6) x y z 6. self-test is only exercised along one direction for each sensitive axis. set to 2 g mode stoc acc +192 +270 +1275 lsb output noise density (4)(7) 7. measured using earth's gravitational field (1 g ) with the device oriented horizont ally (+z axis up) and stationary. odr = 400 hz, normal mode nd acc-nm 126 g/ hz odr = 400 hz, low-noise mode (1) nd acc-lnm 99 g/hz operating temperature range top -40 +85 c
FXLS8471Q sensors 14 freescale semiconductor, inc. 5.2 electrical characteristics table 3. electrical characteristics @ vdd = 2.5 v , vddio = 1.8 v t = 25c unless otherwise noted . parameter test conditions symbol min typ max unit supply voltage vdd 1.95 2.5 3.6 v interface supply voltage vddio 1.62 1.8 3.6 v low-power acceleration mode odr = 12.5 hz idd acc-lpm 8 a odr = 100 hz 35 odr = 400 hz 130 normal acceleration mode odr = 50 hz idd acc-nm 35 a odr = 200 hz 130 odr = 800 hz 240 current during boot sequence, 0.9 ms max duration using recommended regulator bypass capacitor vdd = 2.5 v idd boot 3ma value of capacitor on byp pin -40c to 85c c byp 75 100 470 nf standby mode current @ 25c standby mode idd stby 2 a standby mode current over-temperature range standby mode idd stby 10 a digital high-level input voltage rst pin vih rst 1.04 v digital low-level input voltage rst pin vil rst 0.68 v digital high-level input voltage scl, sda, sa0, sa1 vih 0.75*vddio v digital low-level input voltage scl, sda, sa0, sa1 vil 0.3*vddio v high-level output voltage int1, int2 i o = 500 a voh 0.9*vddio v low-level output voltage int1, int2 i o = 500 a vol 0.1*vddio v low-level output voltage sda i o = 500 a vol sda 0.1*vddio v scl, sda pin leakage 25c 1.0 na -40c to 85c 4.0 scl, sda pin capacitance 3pf vdd rise time 0.001 1000 ms boot time (1) 1. time from vddio on and vdd > vdd min until i 2 c/spi interface ready for operation. t boot 1000 s turn-on time 1 (2) 2. time to obtain valid data from power-down mode to active mode. t por act 2/odr + 2 ms turn-on time 2 (3) 3. time to obtain valid data from standby mode to active mode. t stby act 2/odr + 1 ms operating temperature range t op -40 +85 c
FXLS8471Q sensors freescale semiconductor, inc. 15 5.3 absolute maximum ratings stresses above those listed as ?absolute maximum ratings? may cause permanent damage to the device. this is a stress rating only and functional operation of the device under these conditions is not implied. exposure to maximum rating conditions for extended periods may affect device reliability. table 5. maximum ratings rating symbol value unit maximum acceleration (all axes, 100 s) g max 5,000 g supply voltage, io voltage vdd max / vddio max -0.3 to +3.6 v input voltage on any control pin (sa0/miso, sa1/cs_b, scl/sclk, sda/mosi, rst) vin max -0.3 to vddio + 0.3 v drop-test height d drop 1.8 m storage temperature range t stg -40 to +125 c table 6. esd and latchup protection characteristics rating symbol value unit human body model hbm 2000 v machine model mm 200 v charge device model cdm 500 v latchup current at t = 85c i lu 100 ma this device is sensitive to mec hanical shock. improper handling can c ause permanent damage to the part or cause the part to otherwise fail. this device is sensitive to esd, improper handling can cause permanent damage to the part.
FXLS8471Q sensors 16 freescale semiconductor, inc. 6 digital interfaces 6.1 i 2 c interface characteristics figure 5. i 2 c slave timing diagram table 7. i 2 c slave timing values (1) 1. all values referred to vih (min) and vil (max) levels. parameter symbol i 2 c fast mode unit min max scl clock frequency f scl 0 400 khz bus free time between stop and start condition t buf 1.3 s (repeated) start hold time t hd;sta 0.6 s (repeated) start setup time t su;sta 0.6 s stop condition setup time t su;sto 0.6 s sda data hold time t hd;dat 0.05 0.9 (2) 2. this device does not stretch the low period (t low ) of the scl signal. s sda valid time (3) 3. t vd;dat = time for data signal from scl low to sda output. t vd;dat 0.9 (2) s sda valid acknowledge time (4) 4. t vd;ack = time for acknowledgement signal from scl low to sd a output (high or low, depending on which one is worse). t vd;ack 0.9 (2) s sda setup time t su;dat 100 ns scl clock low time t low 1.3 s scl clock high time t high 0.6 s sda and scl rise time t r 20 + 0.1 c b (5) 5. c b = total capacitance of one bus line in pf. 300 ns sda and scl fall time t f 20 + 0.1 c b (5) 300 ns pulse width of spikes on sda and scl that must be suppressed by internal input filter t sp 05 0n s handbook, full pagewidth msc610 s sr t su;sto t su;sta t hd;sta t high t low t su;dat t hd;dat t f sda scl p s t buf t r t f t r t sp t hd;sta
FXLS8471Q sensors freescale semiconductor, inc. 17 6.1.1 general i 2 c operation there are two signals associated with the i 2 c bus: the serial clock line (scl) and the seri al data line (sda). the latter is a bidirectional line used for sending and receiving the data to/from the interface. external pullup resistors connected to vddio are required for sda and scl. when the bus is free both the lines are high. the i 2 c interface is compliant with fast mode (400 khz), and normal mode (100 khz) i 2 c standards. operation at frequencies higher th an 400 khz is possible, but depends on several factors including the pullup resistor values, and total bus capacitance (trace + device capacitance). see table 8 for more information. a transaction on the bus is started through a start condition (s t) signal, which is defined as a high-to-low transition on the data line while the scl line is held high. after the st signal ha s been transmitted by the master, the bus is considered busy. the next byte of data transmitted contains the slave address in the first seven bits, and the eighth bit, the read/write bit, i ndicates whether the master is receiving data from the slave or transmitting data to the slave. when an address is sent, each device in the system compares the first seven bits after the st conditi on with its own address. if they ma tch, the device considers itsel f addressed by the master. the 9th clock puls e, following the slave address byte (and ea ch subsequent byte) is the acknowledge (ack). the transmitter must release the sda line during the ack pe riod. the receiver must then pull the data line low so that i t remains stable low during the high period of the acknowledge clock period. the number of bytes per transfer is unlimited. if a receiver can't receive another complete byte of data until it has performed some other function, it can hold the clock line, scl low to force the transmitter into a wait state. data transfer only continues wh en the receiver is ready for another byte and releases the data line. this delay action is called clock stretching. not all receiver d evices support clock stretching. not all master devices recognize cl ock stretching. this part does not use clock stretching. a low to high transition on the sda line while the scl line is hi gh is defined as a stop conditi on (sp) signal. a write or burs t write is always terminated by the master issuing the sp signal. a mast er should properly terminate a read by not acknowledging a byte at the appropriate time in the protocol. a master may also issue a repeated start signal (sr) during a transfer the slave addresses that may be assigned to the FXLS8471Q part are 0x1c, 0x1d, 0x1e, or 0x1f. the selection is made through the logic level of the sa1 and sa0 inputs. 6.1.2 i 2 c read/write operations single-byte read the master (or mcu) transmits a start condition (st) to the fx ls8471q, followed by the slave address, with the r/w bit set to ?0? for a write, and the FXLS8471Q sends an acknowledgement. then the master (or mcu) transmits the address of the register to read and the FXLS8471Q sends an acknowledgement. the mast er (or mcu) transmits a repeated start condition (sr), followed by the slave address with the r/w bit set to ?1? for a read from the previously selected register. the FXLS8471Q then acknowledges and transmits the data from the requested register . the master does not acknowle dge (nak) the transmitted data, but transmits a stop condition to end the data transfer. multiple-byte read when performing a multi-byte or ?burst? r ead, the FXLS8471Q automatically increments the register address read pointer after a read command is received. therefore, after following the steps of a single-byte read, multiple bytes of data can be read from sequential registers after each FXLS8471Q acknowledgment (ak) is received until a no acknowledge (nak) occurs from the master followed by a stop condition (sp) signaling an end of transmission. single-byte write to start a write command, the master transmits a start condition (st) to the FXLS8471Q, followed by the slave address with the r/ w bit set to ?0? for a write, and the FXLS8471Q sends an ackno wledgement. then the master (or mcu) transmits the address of the register to write to, and the FXLS8471Q sends an acknowledge ment. then the master (or mcu) transmits the 8-bit data to write to the designated register and the FXLS8471Q sends an acknowledgement that it has received the data. since this transmission is complete, the master transmits a stop condition (sp) to end the data transfer. the data sent to the FXLS8471Q is now stored in the appropriate register. table 8. i 2 c slave address sa1 sa0 slave address 0 0 0x1e 010 x 1 d 100 x 1 c 1 1 0x1f
FXLS8471Q sensors 18 freescale semiconductor, inc. multiple-byte write the FXLS8471Q automatically increments the re gister address write pointer after a write command is received. therefore, after following the steps of a single-byte write, multiple bytes of data can be written to sequential registers after each FXLS8471Q acknowledgment (ack) is received. figure 6. i 2 c timing diagram < single-byte read > master st device address[6:0] w register address[7:0] sr device address[6:0] r nak sp slave ak ak ak data[7:0] < multiple-byte read > master st device address[6:0] w register address[7:0] sr device address[6:0] r ak slave ak ak ak data[7:0] master ak ak nak sp slave data[7:0] data[7:0] data[7:0] < multiple-byte write > master st device address[6:0] w register address[7:0] data[7:0] data[7:0] sp slave ak ak ak ak < single-byte write > master st device address[6:0] w register address[7:0] data[7:0] sp slave ak ak ak legend st: start condition sp: stop condition nak: no acknowledge w: write = 0 sr: repeated start condition ak: acknowledge r: read = 1
FXLS8471Q sensors freescale semiconductor, inc. 19 6.2 spi interface characteristics spi interface is a classical master/slave serial port. the fxls 8471q is always considered as the slave and thus is never initia ting the communication. table 9 and figure 7 describe the timing requi rements for the spi system. figure 7. spi timing diagram 6.2.1 general spi operation the cs_b pin is driven low at the start of a spi transaction, held low for the durati on of the transaction, and driven high aft er the transaction is complete. during a transaction the master togg les the spi clock (sclk) and transmits data on the mosi pin. a write operation is initiated by transmitting a 1 for the r/w bi t. then the 8-bit register addre ss, addr[7:0] is encoded in th e first and second serialized bytes. data to be written starts in the third serialized byte. the order of the bits is as follows: byte 0: r/w,addr[6],addr[5],ad dr[4],addr[3],addr[2],addr[1],addr[0], byte 1: addr[7],x,x,x,x,x,x,x, byte 2: data[7],data[6],data[5],data[4],data[3],data[2],data[1],data[0]. multiple bytes of data may be transmitted. the x indicates a bit that is ignored by the part. the register address is auto- incremented so that the next clock edges will latch the data for the next register. when desired, the rising edge on cs_b stops the spi communication. the FXLS8471Q spi configuration is as follows: ? polarity: rising/falling ? phase: sample/setup ? order: msb first data is sampled during the rising edge of sclk and set up during the falling edge of sclk. table 9. spi timing function symbol min max unit operating frequency o f ? 1 mhz sclk period tsclk 1000 ? ns sclk high time tclkh 500 ? ns sclk low time tclkl 500 ? ns cs_b lead time tscs 65 ? ns cs_b lag time thcs 65 ? ns mosi data setup time tset 25 ? ns mosi data hold time thold 75 ? ns miso data valid (after sclk low edge) tddly ? 500 ns width cs high twcs 100 ? ns cs_b sclk mosi miso
FXLS8471Q sensors 20 freescale semiconductor, inc. 6.2.2 spi read/write operations a read operation is initiated by transmitti ng a 0 for the r/w bit. then the 8-bit regist er address, addr[7:0] is encoded in the first and second serialized bytes. subsequent bits are ignored by the part. the read data is deserialized from the miso pin. similarly a write operation is initiated by transmitting a 1 for the r/w bit. after the first and second serialized bytes multi ple- data bytes can be transmitted into consecutive registers, st arting from the indicated re gister address in addr[7:0]. an spi transaction is started by asserting the cs_b pin (high- to-low transition), and ended by deasserting the cs_b pin (low-to - high transition). * data bytes must be transmitted to the sl ave (FXLS8471Q) using the mosi pin by the ma ster when r/w = 1. data bytes will be tra nsmitted by the slave (FXLS8471Q) to the master using the miso pin when r/w = 0. the first 2 bytes are always transmitted by the master usi ng the mosi pin. that is, a transaction is always initiated by master. 1 figure 8. spi single-burst read/write transaction diagram the registers embedded inside FXLS8471Q are accessed through either an i 2 c, or a spi serial interface. to enable either interface the vddio line must be connect ed to the interface supply voltage. if vdd is not present and vddio is present FXLS8471Q is in shutdown mode and communications on the interf ace are ignored. if vddio is held high, vdd can be powered off and the communications pins will be in a high impedance state. this will allow communications to continue on the bus with other devices. 6.2.3 i 2 c/spi auto detection FXLS8471Q employs an interface mode, auto-d etection circuit that will select either i 2 c or spi interface mode based on the state of the sa0 pin during power up or when exiting reset. once set for i 2 c or spi operation, the device will remain in i 2 c or spi mode until the device is reset or powered down and the auto-detection process is repeated. please not e that when spi interface mode is desired, care must be taken to ensure that no other slave device drives the common sa0/miso pin during the 1 ms period after a hard or soft reset or powerup event. 6.2.4 power supply sequencing and i 2 c/spi mode auto-detection FXLS8471Q does not have any specific power supply sequenc ing requirements between vdd and vddio voltage supplies to ensure normal operation. to ensure correct operation of the i 2 c/spi auto-detection function, vddio should be applied before or at the same time as vdd. if this order cannot be maintained, the user should either toggle t he rst line or power cycle the vdd rail in order to force the auto-detect function to restart and co rrectly identify the desired in terface. FXLS8471Q will indicat e completion of the reset sequence by toggling the int1 pin from logic high to low to hi gh over a 500 ns period. if the int1 pin was already low prior to the reset event, it will only go high. r/w bit followed by addr [6:0] addr[7] followed by 7 ?don?t care? bits data0* data1 ? datan table 10. serial interface pin descriptions pin name pin description vddio digital interface power sa1/cs_b i 2 c second least significant bit of device address/spi chip select scl/sclk i 2 c/spi serial clock sda/mosi i 2 c serial data/spi master serial data out slave serial data in sa0/miso i 2 c least significant bit of the device addre ss/spi master serial data in slave out table 11. i 2 c/spi auto detection sa0 slave address gnd i 2 c vddio i 2 c floating spi
FXLS8471Q sensors freescale semiconductor, inc. 21 7 modes of operation figure 9. FXLS8471Q power mode transition diagram all register contents are pres erved when transitioning from active to stand by mode, but some registers are reset when transitioning from standby to active. these registers are noted in table 13, ?register address map,? on page 25 . the sleep and wake modes are active modes. for more information on how to use the sleep and wake modes and configuring the device to transition between them, please refer to section 8, ?embedded functionality? or freescale application note an4074. table 12. mode of operation description mode i 2 c/spi bus state vdd vddio function description off powered down <1.8 v vddio can be > vdd the device is powered off. all analog and digital blocks are shutdown. i 2 c bus inhibited. standby i 2 c/spi communication with FXLS8471Q is possible on vddio = high vdd = high active bit is cleared only digital blocks are enabled. analog subsystem is disabled. internal clocks disabled. active (wake/sleep) i 2 c/spi communication with FXLS8471Q is possible on vddio = high vdd = high active bit is set all blocks are enabled (digital and analog). sleep wake standby off active
FXLS8471Q sensors 22 freescale semiconductor, inc. 8 embedded functionality FXLS8471Q is a low-power, digital output 3-axis acceleration sensor with both i 2 c and spi interface options. extensive embedded functionality is provided to detec t inertial events at low power, with th e ability to notify the host processor via ei ther of the two programmable interrupt pins. the embedded functionality includes: ? 8-bit or 14-bit accelerometer data with an option for high-pass filtered output data ? four different oversampling options for the output data. the oversampling settings allow the end user to optimize the resolution versus power consumption trade-off in a given application. ? a low-noise accelerometer mode that functions independent ly of the oversampling modes for even higher resolution ? low-power auto-wake/sleep function for conser ving power in portable battery powered applications ? accelerometer pulse detection circuit which can be used to detect directional single and double taps ? accelerometer directional motion and freefall event detection with programmable threshold and debounce time ? acceleration transient detection with programmable threshold and debounce time. transient detection can employ either a high-pass filter or use the difference between reference and current sample values. ? orientation detection with programmable hysteresis for smoot h transitions between portrait and landscape orientations ? accelerometer vector-magnitude change event detection with programmable reference, threshold, and debounce time values many different configurations of the above functions are possible to suit the needs of the end application. separate applicatio n notes are available to further ex plain the different configuratio n settings and potential use cases. 8.1 factory calibration FXLS8471Q is factory calibrated for sensitivit y and offset on each axis. the trim values are stored in non-volatile memory (nvm ). on startup, the trim parameters are read from nvm and applied to the internal com pensation circuitry. after mounting the device to the pcb, the user may further adjust the accelerometer offs ets through the off_x/y/z registers. for more information on accelerometer calibration, refer to freescale application note an4069. 8.2 8-bit or 14-bit data the measured acceleration data is stored in the out_x_ msb, out_x_lsb, out_y_msb, out_y_lsb, out_z_msb, and out_z_lsb registers as 2?s complement 14-bit numbers. the most significant 8-bits of each axis are stored in the out_x, y , z_msb registers, so applications needing only 8-bit resu lts simply read these three registers and ignore the out_x,y , z_lsb registers. to do this, the f_read mode bit in ctrl_reg1 must be set. when the full-scale range is set to 2 g , the measurement range is -2 g to +1.999 g , and each count corresponds to 0.244 mg at 14-bits resolution. when the full-scale is set to 8 g , the measurement range is -8 g to +7.996 g , and each count corresponds to 0.976 mg. the resolution is reduced by a factor of 64 if only the 8-bit results are used (ctrl_reg1[ f_read ] = 1). for further information on the different data formats and modes, please refer to freescale application note an4076. 8.3 low-power modes vers us high-resolution modes FXLS8471Q can be optimized for lower power or higher resolution of the accelerometer output data. high resolution is achieved by setting the lnoise bit in register 0x 2a. this improves the resolution (by loweri ng the noise), but be aware that the dynamic range becomes fixed at 4 g when this bit is set. this will affect all internal embedded functions (scaling of thresholds, etc.) and reduce noise. another method fo r improving the resolution of the data is th rough oversampling. one of the oversampling schemes of the output data ca n be activated when ctrl_reg2[ mods ] = 2?b10 which will improve the resolution of the output data without affecting the internal embedded functions or fixing the dynamic range. there is a trade-off between low power and high resolution. low power can be achieved when the ov ersampling rate is reduced. when ctrl_reg2[ mods ] = 2?b10, the lowest power is achieved, at the ex pense of higher noise. in general, the lower the selected odr and osr, the lower the power consumption. for more information on how to configure the device in low-power or high-resolution modes and understand the benefits and trade-offs , please refer to freescale application note an4075.
FXLS8471Q sensors freescale semiconductor, inc. 23 8.4 auto-wake/sleep mode FXLS8471Q can be configured to transition between sample rates (with their respective current consumptions) based on the status of the embedded interrupt event generators in the device. the advantage of using the auto-w ake/sleep is t hat the system can automatically transition to a higher sample rate (higher cu rrent consumption) when needed but spends the majority of the time in the sleep mode (lower current) when the device does not require higher sampling rates. auto-wake refers to the device being triggered by one of the interrupt event functions to transition to a higher sample rate. this may also interrupt the proc essor to transition from a sleep mode to a higher power mode. sleep mode occurs when none of the enabled interrupt event functi ons has detected an interrupt within the user-defined, time- out period. the device will then transition to the specified lower sample rate. it may also alert the processor to go into a lo wer power mode to save power during this period of inactivity. please refer to an4074 for more detailed information on configuring the au to- wake/sleep function. 8.5 freefall and motion event detection FXLS8471Q integrates a programmable threshold based acceleration detection function capable of detecting either motion or freefall events depending upon the configuration. for further de tails and examples on using the embedded freefall and motion detection functions, please refer to freescale application note an4070. 8.5.1 freefall detection the detection of ?freefall? invo lves the monitoring of the x, y , and z axes for the condition where the acceleration magnitude is below a user-specified threshold for a user-definable amount of time. typically, the usable threshold ranges are between 100 mg and 500 mg. 8.5.2 motion detection motion detection is often used to alert the main processor that the device is currently in use. when the acceleration exceeds a set threshold for a set amount of time, the motion interrupt is asserted. a motion can be a fast moving shake or a slow moving tilt. this will depend on the threshold and timing values configured for the event. the motion detection function can analyze s tatic acceleration changes or faster jolts. the timing value is set by a configurable debounce counter. the debounce counter acts lik e a filter to indicate whether the condition exists for longer than a set amount of time (that is, 100 ms or longer). there is al so directional data available in the source register to detect the di rection of the motion that gener ated the interrupt. this is u seful for applications such as directional shake or flick detection, and c an also assist gesture detection algorithms by indicating that a motion gesture has started. 8.6 transient detection FXLS8471Q integrates an acceleration transient detection function that incorporates a high-pass filter. acceleration data goes through the high-pass filter, eliminating the dc tilt offset and low frequency acceleration changes. the high-pass filter cutof f can be set by the user to four different frequencies which are de pendent on the selected output da ta rate (odr). a higher cutoff frequency ensures that dc and slowly changing acceleration data will be filtered out, allowing only the higher frequencies to p ass. the transient detection feature can be used in the same manner as the motion detection by bypassing the high-pass filter. there is an option in the configuration register to do this. this adds more flexibility to cover the various customer use cases. many applications use the accelerometer?s static acceleration readings (that is, tilt) which measure the change in acceleration due to gravity only. these functions benefit from acceleration data being filtered with a low-pass filter where high-frequency data is considered noise. however, there are many functions where the accelerometer must analyze dynamic acceleration. functions such as tap, flick, shake and step counting are based on the anal ysis of the change in the dyna mic acceleration. the transient detection function can be routed to either interrupt pin through bit 5 in ctrl_reg5 register (0x2e). registers 0x1d ? 0x20 are used for configuring the transient detection function. the source register contains directional data to determine the direction of the transient acceleration, either positive or negative. for further information of the embedde d transient detection function a long with specific application examples and re commended configuration settings, refer to freescale application note an4461. 8.7 pulse detection FXLS8471Q has embedded single/double and di rectional pulse detection. this function employs several timers for programming the pulse width time and the latency between pulses. the dete ction thresholds are independently programmable for each axis. the acceleration data input to the pulse detection circuit can be put through both high and low- pass filters, allowing for grea ter flexibility in discriminating between pulse and tap events. the pu lse_src register provides information on the axis, direction (polarity), and single/double event status fo r the detected pulse or tap. for more in formation on how to configure the device f or pulse detection, please refer to freescale application note an4072.
FXLS8471Q sensors 24 freescale semiconductor, inc. 8.8 orientation detection FXLS8471Q has an embedded orientation detection algorithm with th e ability to detect all six orientations. the transition angle s and hysteresis are programmable, allowing for a smooth transition between portrait and landscape orientations. the angle at which the device no longer detects the orientation change is referred to as the ?z-lockout angle?. the device oper ates down to 29 from the flat position. all angles are accurate to 2. for further information on the orientation detection f unction refer to freescale application note, an4068. 8.9 acceleration vector-magnitude detection FXLS8471Q incorporates an acceleration vector-magnitude change detection block that can be configured to generate an interrupt when the acceleration magnitude exceeds a preset threshold for a programmed debounce time. the function can be configured to operate in absolute or relative modes, and can also act as a wake to sleep/sleep to wake source. this function is useful for detecting acceleration transients when operated in abs olute mode, or for detecting changes in orientation when operated in relative mode, refer to freescale application note an4692.
FXLS8471Q sensors freescale semiconductor, inc. 25 9 register map table 13. register address map name type register address auto-increment address default hex value comment status[ f_mode ] = 00, ctrl_reg1[ f_read ] = 0 status[ f_mode ] > 00, ctrl_reg1[ f_read ] = 0 status[ f_mode ] = 00, ctrl_reg1[ f_read ] = 1 status[ f_mode ] > 00, ctrl_reg1[ f_read ] = 1 status (1)(2) r 0x00 0x01 0x00 real-time, data-ready status or fifo status (dr_status or f_status) out_x_msb (1)(2) r 0x01 0x02 0x01 0x03 0x01 data [7:0] are 8 msbs of 14-bit sample. root pointer to xyz fifo data. out_x_lsb (1)(2) r 0x02 0x03 0x00 data [7:2] are 6 lsbs of 14-bit sample out_y_msb (1)(2) r 0x03 0x04 0x05 0x00 data [7:0] are 8 msbs of 14-bit sample out_y_lsb (1)(2) r 0x04 0x05 0x00 data [7:2] are 6 lsbs of 14-bit sample out_z_msb (1)(2) r 0x05 0x06 0x00 data [7:0] are 8 msbs of 14-bit sample out_z_lsb (1)(2) r 0x06 0x00 0x00 data [7:2] are 6 lsbs of 14-bit sample reserved ? 0x07- 0x08 ? ? reserved, do not modify f_setup (1)(3) r/w 0x09 0x0a 0x00 fifo setup trig_cfg r/w 0x0a 0x0b 0x00 fifo event trigger configuration register sysmod (1)(2) r 0x0b 0x0c output current system mode int_source (1)(2) r 0x0c 0x0d output interrupt status who_am_i (1) r 0x0d 0x0e 0x6a device id xyz_data_cfg (1)(4) r/w 0x0e 0x0f 0x00 acceleration dynamic range and filter enable settings hp_filter_cutoff (1)(4) r/w 0x0f 0x10 0x00 pulse detection high- pass and low-pass filter enable bits. high-pass filter cutoff frequency selection pl_status (1)(2) r 0x10 0x11 0x00 landscape/portrait orientation status pl_cfg (1)(4) r/w 0x11 0x12 0x83 landscape/portrait configuration. pl_count (1)(3) r/w 0x12 0x13 0x00 landscape/portrait debounce counter pl_bf_zcomp (1)(4) r/w 0x13 0x14 0x00 back/front trip angle threshold pl_ths_reg (1)(4) r/w 0x14 0x15 0x1a portrait to landscape trip threshold angle and hysteresis settings a_ffmt_cfg (1)(4) r/w 0x15 0x16 0x00 freefall/motion function configuration a_ffmt_src (1)(2) r 0x16 0x17 0x00 freefall/motion event source register a_ffmt_ths (1)(3) r/w 0x17 0x18 0x00 freefall/motion threshold register
FXLS8471Q sensors 26 freescale semiconductor, inc. a_ffmt_count (1)(3) r/w 0x18 0x19 0x00 freefall/motion debounce counter reserved ? 0x19- 0x1c ? ? reserved, do not modify transient_cfg (1)(4) r/w 0x1d 0x1e 0x00 transient function configuration transient_src (1)(2) r 0x1e 0x1f 0x00 transient event status register transient_ths (1)(3) r/w 0x1f 0x20 0x00 transient event threshold transient_count (1)(3) r/w 0x20 0x21 0x00 transient debounce counter pulse_cfg (1)(4) r/w 0x21 0x22 0x00 pulse function configuration pulse_src (1)(2) r 0x22 0x23 0x00 pulse function source register pulse_thsx (1)(3) r/w 0x23 0x24 0x00 x-axis pulse threshold pulse_thsy (1)(3) r/w 0x24 0x25 0x00 y-axis pulse threshold pulse_thsz (1)(3) r/w 0x25 0x26 0x00 z-axis pulse threshold pulse_tmlt (1)(4) r/w 0x26 0x27 0x00 time limit for pulse detection pulse_ltcy (1)(4) r/w 0x27 0x28 0x00 latency time for second pulse detection pulse_wind (1)(4) r/w 0x28 0x29 0x00 window time for second pulse detection aslp_count (1)(4) r/w 0x29 0x2a 0x00 in activity counter setting for auto-sleep ctrl_reg1 (1)(4) r/w 0x2a 0x2b 0x00 system odr, accelerometer osr, operating mode ctrl_reg2 (1)(4) r/w 0x2b 0x2c 0x00 self-test, reset, accelerometer osr and sleep mode settings ctrl_reg3 (1)(4) r/w 0x2c 0x2d 0x00 sleep mode interrupt wake enable, interrupt polarity, push-pull/open- drain configuration ctrl_reg4 (1)(4) r/w 0x2d 0x2e 0x00 interrupt enable register ctrl_reg5 (1)(4) r/w 0x2e 0x2f 0x00 interrupt pin (int1/int2) map off_x (1)(4) r/w 0x2f 0x30 0x00 x-axis accelerometer offset adjust off_y (1)(4) r/w 0x30 0x31 0x00 y-axis accelerometer offset adjust off_z (1)(4) r/w 0x31 0x32 0x00 z-axis accelerometer offset adjust reserved r/w 0x32- 0x5e ? ? reserved, do not modify a_vecm_cfg r/w 0x5f 0x60 0x00 acceleration vector- magnitude configuration register a_vecm_ths_msb r/w 0x60 0x61 0x00 acceleration vector- magnitude threshold msb table 13. register address map (continued)
FXLS8471Q sensors freescale semiconductor, inc. 27 note the auto-increment addressing is only e nabled when registers are read us ing burst-read mode when the device is configured for i 2 c or spi. the auto-increment address is automatically reset to 0x00 in i 2 c mode when a stop condition is detected. in spi mode there is no stop condition and the auto-increment address is not automatically reset to 0x00. a_vecm_ths_lsb r/w 0x61 0x62 0x00 acceleration vector- magnitude threshold lsb a_vecm_cnt r/w 0x62 0x63 0x00 acceleration vector- magnitude debounce count a_vecm_initx_msb r/w 0x63 0x64 0x00 acceleration vector- magnitude x-axis reference value msb a_vecm_initx_lsb r/w 0x64 0x65 0x00 acceleration vector- magnitude x-axis reference value lsb a_vecm_inity_msb r/w 0x65 0x66 0x00 acceleration vector- magnitude y-axis reference value msb a_vecm_inity_lsb r/w 0x66 0x67 0x00 acceleration vector- magnitude y-axis reference value lsb a_vecm_initz_msb r/w 0x67 0x68 0x00 acceleration vector- magnitude z-axis reference value msb a_vecm_initz_lsb r/w 0x68 0x69 0x00 acceleration vector- magnitude z-axis reference value lsb reserved ? 0x69- 0x72 ? ? reserved, do not modify a_ffmt_ths_x_msb r/w 0x73 0x74 0x00 x-axis fmt threshold msb a_ffmt_ths_x_lsb r/w 0x74 0x75 0x00 x-axis ffmt threshold lsb a_ffmt_ths_y_msb r/w 0x75 0x76 0x00 y-axis ffmt threshold msb a_ffmt_ths_y_lsb r/w 0x76 0x77 0x00 y-axis ffmt threshold lsb a_ffmt_ths_z_msb r/w 0x77 0x78 0x00 z-axis ffmt threshold msb a_ffmt_ths_z_lsb r/w 0x78 0x79 0x00 z-axis ffmt threshold lsb reserved ? 0x79 - 0xff ? ? reserved, do not modify 1. register contents are preserved when transitioning from active to standby mode. 2. register contents are reset when trans itioning from standby to active mode. 3. register contents can be modified anytime in standby or active mode. a write to this register will cause a reset of the corre sponding internal system debounce counter. 4. modification of this register?s contents can only occur when device is in standby mode, except the fs[1:0] bit fields in ctrl _reg1 register. table 13. register address map (continued)
FXLS8471Q sensors 28 freescale semiconductor, inc. 10 registers by functional blocks 10.1 device configuration 10.1.1 status (0x00) register the status register aliases allow for the contiguous burst read of both status and current acceleration sample/fifo data using the auto-increment addressing mechani sm in both 8- and 14-bit modes. 10.1.2 dr_status (0x00) register data-ready status when f_setup[ f_mode ] = 0x00 this status register provides the acquisition status information on a per-sample basis, and reflects real-time updates to the out_x, out_y, and out_z registers. when the fifo subsystem da ta output register driver is disabled (f_setup[ f_mode ] = 2?b00), this regist er indicates the real- time status information of the accelerometer x, y, and z axes sample data. table 14. status register dr_status or f_status 00000000 table 15. status description field description f_setup[ f_mode ] = 2?b00 register 0x00 dr_status f_setup[ f_mode ] > 2?b00 register 0x00 f_status table 16. dr_status register zyxow zow yow xow zyxdr zdr ydr xdr 00000000 table 17. dr_status description field description zyxow zyxow is set to 1 whenever new data is acquired before completing the retrieval of the previous set. this event occurs when the content of at least one acceleration data register (that is, out_x, out_y, and out_z) has been overwritten. zyxow is cleared when the high-bytes of the acceleration data (out_x_msb, out_y_msb, and out_z_msb) are read. x, y, z-axis data overwrite. 0: no data overwrite has occurred 1: previous x, y, z data was overwritten by new x, y, z data before it was completely read zow zow is set to 1 whenever a new z-axis acquis ition is completed before the retrieval of the previous data. when this occurs the previous data is overwritten. zow is cl eared anytime out_z_msb register is read. z-axis data overwrite. 0: no data overwrite has occurred 1: previous z-axis data was overwritten by new z-axis data before it was read yow yow is set to 1 whenever a new y-axis acquisition is completed be fore the retrieval of the previous data. when this occurs the previous data is overwritten. yow is cl eared anytime out_y_msb register is read. y-axis data overwrite. 0: no data overwrite has occurred 1: previous y-axis data was overwritte n by new y-axis data before it was read xow xow is set to 1 whenever a new x-axis acquisi tion is completed before the retrieval of the previous data. when this occurs the previous data is overwritten. xow is cl eared anytime out_x_msb register is read. x-axis data overwrite. 0: no data overwrite has occurred 1: previous x-axis data was overwritten by new x-axis data before it was read
FXLS8471Q sensors freescale semiconductor, inc. 29 10.1.3 f_status (0x00) register fifo status when f_setup[ f_mode ] = 0x00 > 0x00. if the fifo subsystem data output register driver is enabled, the status register indicates the current st atus information of t he fifo subsystem. the f_ovf and f_wmrk_flag flags remain asserted while the event source is still active, but the user can clear the fifo interrupt bit in the interrupt source register (int_source) by reading the f_status register. in this case, the int_source[ src_fifo ] bit will be set again when the next data sample enters the fifo. therefore the f_ovf bit will remain asserted while the fifo has overflowed and the f_wmrk_flag bit will remain asserted while the f_cnt value is equal to or greater than then f_wmrk value. zyxdr zyxdr signals that a new acquisition for any of the enabled chan nels is available. zyxdr is cleared when the high-bytes of the acceleration data (out_x_msb, out_y_msb, out_z_msb) are read. x, y, z-axis new data ready. 0: no new set of data ready 1: new set of data is ready zdr zdr is set to 1 whenever a new z-axis data acquisition is completed. zdr is cleared anytime the out_z_msb register is read. z-axis new data available. 0: no new z-axis data is ready 1: new z-axis data is ready ydr ydr is set to 1 whenever a new y-ax is data acquisition is completed. ydr is cleared anytime the out_y_msb register is read. y-axis new data available. default value: 0 0: no new y-axis data ready 1: new y-axis data is ready xdr xdr is set to 1 whenever a new x-ax is data acquisition is completed. xdr is cleared anytime the out_x_msb register is read. x-axis new data available. default value: 0 0: no new x-axis data ready 1: new x-axis data is ready table 18. f_status register f_ovf f_wmrk_flag f_cnt[5:0] 00 0 table 19. fifo flag event descriptions f_ovf f_wmrk_flag event description 0 x no fifo overflow events detected. 1 x fifo overflow event detected. x 0 no fifo watermark event detected. x1 a fifo watermark event was detected indicating that a fifo sample count greater than watermark value has been reached. if f_setup[ f_mode ] = 2?b11, a fifo trigger event was detected table 20. fifo sample count bit description field description f_cnt[5:0] these bits indicate the number of acceleration samples cu rrently stored in the fifo buffer. count 6?b000000 indicates that the fifo is empty. fifo sample counter. default value 6?b000000. (6?b000001 to 6?b100000 indicates 1 to 32 samples stored in fifo table 17. dr_status description (continued)
FXLS8471Q sensors 30 freescale semiconductor, inc. 10.1.4 trig_cfg (0x0a) register fifo trigger configuration regist er. after the interrupt flag of the enabled event in trig_cfg is set, the fifo (when configure d in trigger mode) is gated at the time of the interrupt event preventing the further collection of data samples. this allows the host processor to analyze the data leading up to the event detection (up to 32 samples). for detailed information on how to utilize the fifo and the various trigger events, please se e an4073 available on the freescale website. 10.1.5 sysmod (0x0b) register the system mode register indicates the current device ope rating mode. applications using the auto-sleep/auto-wake mechanism should use this regi ster to synchronize their app lication with the device operating mode. the system mode register also indicates the status of the fifo gate error flag and the time elapsed since the fifo gate error flag was asserted. table 21. trig_cfg register ? ? trig_trans trig_lndprt trig_pulse trig_ffmt trig_a_vecm ? 00000000 table 22. trig_cfg bit descriptions field description trig_trans transient interrupt fifo trigger enable. trig_lndprt landscape/portrait orientation interrupt fifo trigger enable. trig_pulse pulse interrupt fifo trigger enable trig_ffmt freefall/motion interrupt fifo trigger enable trig_a_vecm acceleration vector -magnitude fifo trigger enable. table 23. sysmod register fgerr fgt[4:0] sysmod[1:0] table 24. sysmod bit description field description fgerr fifo gate error. default value: 0. 0: no fifo gate error detected. 1: fifo gate error was detected. emptying the fifo buffer clears the fgerr bit in the sysmod register. see ctrl_reg3 [interrupt ctrl register] (0x2c) for mo re information on configuri ng the fifo gate function. fgt[4:0] number of odr time units since fgerr was asserted. reset when fgerr is cleared sysmod[1:0] system mode. default value: 0. 00: standby mode 01: wake mode 10: sleep mode
FXLS8471Q sensors freescale semiconductor, inc. 31 10.1.6 int_source (0x0c) register interrupt source register. the bits that are set (logic ?1?) i ndicate which function has asserted its interrupt and conversely bits that are cleared (logic ?0?) indicate which function has not asserted its interrupt. reading the int_source register does not clear any interrupt st atus bits (except for src_a_vecm, see below); the respective interrupt flag bits are reset by reading the appropriate sour ce register for the function that generated the interrupt. table 25. int_source register src_aslp src_fifo src_trans src_lndprt src_pulse src_ffmt src_a_vecm src_drdy table 26. int_source bit descriptions field description src_aslp auto-sleep/wake interrupt status bit: logic ?1? indicates that an interrupt event that can cause a wake to sleep or sleep to wake system mode transition has occurred and logic ?0? indicates that no wake to sleep or sleep to wake system mode transition interrupt event has occurred. the ?wake-to-sleep? transition occurs when a period of i nactivity that exceeds the user-specified time limit (aslp_count) has been detected, thus causing the system to transition to a user -specified low odr setting. a ?sleep-to-wake? transition occurs when the user-specified interrupt event has awakened the system, thus causing the system to transition to the us er-specified higher odr setting. reading the sysmod register will clear the src_aslp bit. src_fifo fifo interrupt status bit: logic ?1? indicates that a fifo interrupt event such as an overflow or watermark (f_status[ f_cnt ] = f_status[ f_wmrk ]) event has occurred and logic ?0? indicate s that no fifo interrupt event has occurred. this bit is cleared by reading the f_status register. src_trans transient interrupt status bit: logic ?1? indicates that an ac celeration transient value greater than user-specified threshold has occurred. and logic ?0? indicates that no transient event has occurred. this bit is asserted whenever transient_src[ ea ] is asserted and the functional block interrupt has been enabled. this bit is cleared by readi ng the transient_src register. src_lndprt landscape/portrait orientation interrupt status bit: logic ?1? indicates that an interrupt was generated due to a change in the device orientation status and logic ?0? indicates t hat no change in orientation status was detected. this bit is asserted whenever pl_status[ newlp ] is asserted and the functional block interrupt has been enabled. this bit is cleared by r eading the pl_status register. src_pulse pulse interrupt status bit: logic ?1? indicates that an inte rrupt was generated due to single- and/or double- pulse event and logic ?0? indicates that no pulse event was detected. this bit is asserted whenever pulse_src[ ea ] is asserted and the functional block interrupt has been enabled. this bit is cleared by r eading the pulse_src register. src_ffmt freefall/motion interrupt status bit: logic ?1? indicates that the freefall/motion function interrupt is active and logic ?0? indicates that no freefall or motion event was detected. this bit is asserted whenever pulse_src[ ea ] is asserted and the functional block interrupt has been enabled. this bit is cleared by readi ng the a_ffmt_src register. src_a_vecm accelerometer vector-magnitude interrupt status bit: logic ?1 ? indicates that an interrupt was generated due to acceleration vector-magnitude function and logic ?0? indicates that no inte rrupt has been generated. this bi t is cleared by reading this register (int_source). src_drdy data-ready interrupt status bit. in accelera tion only mode this bit indicates that new accelerometer data is available to read. the src_drdy interrupt flag is cleared by reading out the accelera tion data from the out_x, out_y, and out_z registers. this data can be burst read using a 6-byte burst read starting from the address 0x01 (out_x_msb).
FXLS8471Q sensors 32 freescale semiconductor, inc. 10.1.7 who_am_i (0x0d) register device identification register. th is register contains the device identifier which is set to 0x6a. 10.1.8 ctrl_reg1 (0x2a) register note except for standby mode selection, the device must be in standby mode to change any of the fields within ctrl_reg1 (0x2a). it is important to note that when the device is in auto-sl eep mode, the system odr and data rate for all the system functional blocks is overridden by the sleep data rate set by the aslp_rate field.. table 31 shows the various system output data rates (odr) that may be selected using the dr[2:0] bits. table 27. who_am_i register who_am_i[7:0] 0x6a table 28. ctrl_reg1 register aslp_rate[1:0] dr[2:0] lnoise f_read active 0 3?b001 0 0 0 table 29. ctrl_reg1 bit descriptions field description aslp_rate[1:0] configures the auto-wake sample frequency when the device is in sleep mode. see table 30 for more information. dr[2:0] output data rate (odr) selection. see table 31 for more information. lnoise reduced noise and full-scale range mode (analog gain times 2). 0: normal mode 1: reduced noise mode; note that the fsr setting is restricted to a 4 g in this mode (lnoise = 1). f_read fast-read mode: data format is limited to the 8-bit msb for accelerometer output data. the auto-address pointer will skip over the lsb addresses for each axes sample data when performing a burst read operation. 0: normal mode 1: fast-read mode active standby/active. 0: standby mode 1: active mode table 30. sleep mode poll rate description aslp_rate1 aslp_rate0 frequency (hz) 0 05 0 0 1 12.5 1 06 . 2 5 1 1 1.56
FXLS8471Q sensors freescale semiconductor, inc. 33 the active bit selects between standby mode and active mode. the default value is 0 (standby mode) on reset. the lnoise bit selects between normal full dynamic range mode and a high sensitivity, low-noise mode. in low-noise mode the maximum signal that can be measured is 4 g. note: any thresholds set above 4 g will not be reached. the f_read bit selects between normal and fast-read modes where the auto-increment counter will also skip over the lsb data bytes when f_read = 1. all of the acceleration data msb?s can be read ou t with a single 3-byte burst read starting at the out_x_msb register when f_read = 1. note the f_read bit can only be changed while f_setup[ f_mode ] = 0. 10.1.9 ctrl_reg2 (0x2b) register table 31. system output data rate selection dr2 dr1 dr0 odr (hz) period (ms) 0 0 0 800.0 1.25 0 0 1 400.0 2.5 0 1 0 200.0 5 0 1 1 100.0 10 100 50.0 20 101 12.5 80 1 1 0 6.25 160 1 1 1 1.5625 640 table 32. ctrl_reg2 register st rst ? smods[1:0] slpe mods[1:0] 000000 table 33. ctrl_reg2 bit descriptions field description st the st bit activates the accelerometer self-test function. when st is set to 1, a change will occu r in the device output levels for each axis, allowing the host application to check the functionality of th e transducer and measurement signal chain. self-test enable: 0: self-test disabled 1: self-test enabled. rst the rst bit is used to initiate a software reset. the reset me chanism can be enabled in both st andby and active modes. when the rst bit is set, the boot mechanism resets all functional block registers and loads the respective inter nal registers with their de fault values. note that the current revision of FXLS8471Q silicon, as identified by a who_am_i value of 0x6a, has an errata associated with the software reset mechanism when the device is operated in spi mode. refer to appendix a.1 for further information and a suggested work-around. after setting the rst bit, the system will automatica lly transition to standby mode. therefore, if the system was already in standby mode, the reboot process will immediately begin; else if the system was in acti ve mode the boot mechanism will automatically transition the system from active mode to standby mode, only then can the reboot process begin. a system reset can also be init iated by pulsing the external rst pin high. the i 2 c and spi communication systems are also reset to avoid co rrupted data transactions. the host application should allow 1 ms between issuing a software (setting rst bit) or hardware (pulsing rst pin) rese t and attempting communications with the device over the i 2 c or spi interfaces. when the spi interface mode is desired and multiple devices are present on the bus, make sure that the bus is quiet (all slave device miso pins are high-z) during this 1 ms period to ensure the device does not inadvertently enter i 2 c mode. see section 6.2.3 for further information about the interface mode auto-detection circuit. at the end of the boot process, the rst bit is hardware cleared. 0: device reset disabled 1: device reset enabled. smods[1:0] sleep mode power scheme selection. see table 34 for more information. slpe (1) 1. when slpe = 1, a transition between sleep mode and wake mode result s in a fifo flush and a reset of internal functional block counters. all functional block status information is preserved except wher e otherwise indicated. for further information, refer to the ct rl_reg3 register description ( fifo_gate bit). auto-sleep mode enable: 0: auto-sleep is not enabled 1: auto-sleep is enabled. mods[1:0] accelerometer osr selection. this setting, along with the od r selection determines the active mode power and rms noise for acceleration measurements. see table 34 for more information.
FXLS8471Q sensors 34 freescale semiconductor, inc. table 34. ctrl_reg2[mods] oversampling modes (s)mods1 (s)mods0 power mode 00n o r m a l 0 1 low noise, low power 1 0 high resolution 1 1 low power table 35. oversampling ratio versus oversampling mode accelerometer osr odr (hz) normal low noise, low power high resolution low power 1.5625 128 32 1024 16 6.25 32 8 256 4 12.5 16 4 128 2 50 4 4 32 2 100 4 4 16 2 200 4 4 8 2 400 4 4 4 2 800 2 2 2 2
FXLS8471Q sensors freescale semiconductor, inc. 35 10.1.10 ctrl_reg3 [interrupt control register] (0x2c) register table 36. ctrl_reg3 register fifo_gate wake_trans wake_lndprt wake_pulse wake_ffmt wake_en_a_vecm ipol pp_od 000 0 0 0 0 0 table 37. ctrl_reg3 bit descriptions field description fifo_gate 0: fifo gate is bypassed. fifo is flushed upon the system mode transitioni ng from wake-to-sleep mode or from sleep- to-wake mode. 1: the fifo input buffer is blocked when transitioning from ?wake-to-sleep? mode or from ?sleep-to-wake? mode until the fifo is flushed. (1) although the system transitions from ?wake-to-sleep ? or from ?sleep-to-wake? the contents of the fifo buffer are preserved, new data samples are ignored until the fifo is emptied by the host application. if the fifo_gate bit is set to logic ?1? and the fifo buffer is not emptied before the arrival of the next sample, then the sysmod[ fgerr ] will be asserted. the sysmod[ fgerr ] bit remains asserted as long as the fifo buffer remains un- emptied. emptying the fifo buffer clears the sys_mod[ fgerr ] register. 1. the fifo contents are flushed whenever the system odr changes in order to prevent the mixing of fifo data from different odr periods. wake_tran 0: transient function is disabled in sleep mode 1: transient function is enabled in sleep mode and can generate an interrupt to wake the system wake_lndprt 0: orientation function is disabled sleep mode. 1: orientation function is enabled in sleep mode and can generate an interrupt to wake the system wake_pulse 0: pulse function is disabled in sleep mode 1: pulse function is enabled in sleep mode and can generate an interrupt to wake the system wake_ffmt 0: freefall/motion function is disabled in sleep mode 1: freefall/motion function is enabled in sleep mo de and can generate an interrupt to wake the system wake_en_a_vecm 0: acceleration vector-magnitude function is disabled in sleep mode 1: acceleration vector-magnitude function is enabled in sl eep mode and can generate an interrupt to wake the system ipol the ipol the bit selects the logic polarity of the interrupt signals output on the int1 and int2 pins. int1/int2 interrupt logic polarity: 0: active low (default) 1: active high pp_od int1/int2 push-pull or open-drain output mode selection. the open-drain configuratio n can be used for connecting multiple interrupt signals on the same interrupt line but wi ll require an external pullup re sistor to function correctly. 0: push-pull (default) 1: open-drain
FXLS8471Q sensors 36 freescale semiconductor, inc. 10.1.11 ctrl_reg4 [interrupt enable register] (0x2d) register the corresponding functional block interrupt enable bit allows the functional block to route its event detection flag to the sy stem?s interrupt controller. the interrupt controller routes the enabled in terrupt signals to either the int1 or int2 pins depending o n the settings made in ctrl_reg5. table 38. ctrl_reg4 register int_en_aslp int_en_fifo int_en_trans int_en_lndprt int_en_pulse int_en_ffmt int_en_a_vecm int_en_drdy 00000000 table 39. interrupt enable register bit descriptions field description int_en_aslp sleep interrupt enable 0: auto-sleep/wake interrupt disabled 1: auto-sleep/wake interrupt enabled int_en_fifo fifo interrupt enable 0: fifo interrupt disabled 1: fifo interrupt enabled int_en_trans transient interrupt enable 0: transient interrupt disabled 1: transient interrupt enabled int_en_lndprt orientation interrupt enable 0: orientation (landscape/portrait) interrupt disabled 1: orientation (landscape/portrait) interrupt enabled int_en_pulse pulse interrupt enable 0: pulse detection interrupt disabled 1: pulse detection interrupt enabled int_en_ffmt freefall/motion interrupt enable 0: freefall/motion interrupt disabled 1: freefall/motion interrupt enabled int_en_a_vecm acceleration vector-magnitude interrupt enable 0: acceleration vector-magnitude interrupt disabled 1: acceleration vector-magnitude interrupt enabled int_en_drdy data-ready interrupt enable 0: data-ready interrupt disabled 1: data-ready interrupt enabled
FXLS8471Q sensors freescale semiconductor, inc. 37 10.1.12 ctrl_reg5 [interrupt routing configuration register] (0x2e) register table 40. ctrl_reg5 register int_cfg_aslp int_cfg_fifo int_cfg_trans int_cfg_lndprt int_cfg_pulse int_cfg_ffmt int_cfg_a_vecm int_cfg_drdy 00000000 table 41. interrupt routing configuration bit descriptions field description int_cfg_aslp sleep interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin int_cfg_fifo fifo interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin int_cfg_trans transient detection interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin int_cfg_lndprt orientation detection interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin int_cfg_pulse pulse detection interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin int_cfg_ffmt freefall/motion detection interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin int_cfg_a_vecm acceleration vector-magnitude interrupt routing 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin. int_cfg_drdy int1/int2 configuration. 0: interrupt is routed to int2 pin 1: interrupt is routed to int1 pin.
FXLS8471Q sensors 38 freescale semiconductor, inc. figure 10. interrupt controller block diagram the system?s interrupt controller uses the corresponding bit field in the ctrl_reg5 register to determine the routing for the i nt1 and int2 interrupt pins. for example, if the int_cfg_drdy bit value is logic ?0? the functional block?s interrupt is routed to int2, and if the bit value is logic ?1? then the interrupt is routed to in t1. all interrupt signals routed to either int1 or int2 are logically or?ed together as illustrated in figure 11 , thus one or more functional blocks can assert an interrupt pin simultaneously; therefore a host application responding to an interrupt should read the int_so urce register to determine the source(s) of the interrupt(s). figure 11. int1/int2 pin control logic interrupt controller data ready freefall/motion detection pulse detection orientation detection transient acceleration detection auto-sleep int enable int cfg int1 int2 99 acceleration vector-magnitude fifo interrupt int1 int2 src_rts src_fifo src_pulse src_ff_mt or or src_drdy
FXLS8471Q sensors freescale semiconductor, inc. 39 10.2 auto-sleep trigger 10.2.1 aslp_count (0x29) register the aslp_count register sets the minimum time period of event flag inactivity required to init iate a change from the current active mode odr value specified in ctrl_reg1[ dr ] to the sleep mode odr value specified in ctrl_reg1[ aslp_rate ], provided that ctrl_reg2[ slpe] = 1. see table 45 for functional blocks that may be monitored for inacti vity in order to trigger the return-to-sleep event. * if the fifo_gate bit is set to logic ?1?, the assertion of the src_aslp interru pt does not prevent the system from transitioning to sleep or fr om wake mode; instead it prevents the fifo buffer from accepting new sample data until the host application flushes the fifo buffer. the interrupt sources listed in table 45 affect the auto-sleep, return to sleep and wake from sleep mechanism only if they have been previously enabled. the functional block event flags that are bypassed while the system is in auto-sleep mode are temporary disabled (see section 10.1.10, ?ctrl_reg3 [i nterrupt control register] (0x2c) register,? on page 35 for more information) and are automatically re-enabled when the device returns from auto-sleep mode (that is, wakes up), except for the data ready function. if any of the interrupt sources listed under the return-to-sleep column is asserted before the sleep counter reaches the value specified in aslp_count, then all sleep mode transitions are termi nated and the internal sleep counter is reset. if none of the interrupts listed under the return-to-sleep column are asserted within the time limit specified by the aslp_count register, the system will transition to the sleep mode and use the odr value specified in ctrl_reg1[ aslp_rate ]. table 42. aslp_count register aslp_cnt[7:0] 8?b00000000 table 43. aslp_count bit description field description aslp_cnt[7:0] see table 44 for details table 44. aslp_count relationship with odr output data rate (odr) maximum inactivity time (s) odr time step (ms) aslp_count step (ms) 800 81 1.25 320 400 81 2.5 320 200 81 5 320 100 81 10 320 50 81 20 320 12.5 81 80 320 6.25 81 160 320 1.56 63 640 640 table 45. sleep/wake mo de gates and triggers interrupt source event restarts time and delays return-to-sleep event will wake-from-sleep src_fifo yes no src_trans yes yes src_lndprt yes yes src_pulse yes yes src_ffmt yes yes src_aslp no* no* src_avecm yes yes
FXLS8471Q sensors 40 freescale semiconductor, inc. if any of the interrupt sources listed und er the ?wake-from-sleep? column is assert ed, then the system will transition out of t he low sample rate auto-sleep mode to the user-specified fast sa mple rate provided the user-specified wake event function is enabled in register ctrl_reg3. if the auto-sleep interrupt is enabled, a transition from active mode to sleep m ode and vice-versa will generate an interrupt. if ctrl_reg3[ fifo_gate ] = 1, transitioning to auto -sleep mode will preserve th e fifo contents, set sysmod[ fgerr ] (fifo gate error), and stop new acquisitions. the syst em will wait for the fifo buffer to be emptied by the host application before new samples can be acquired. figure 12. auto-sleep state transition diagram acquire standby no sleep standby sleep active mode auto-sleep mode slp_counter < slp_counter > aslp count aslp count
FXLS8471Q sensors freescale semiconductor, inc. 41 10.3 output data registers 10.3.1 out_x_msb (0x01), out_x_lsb (0x02), out_y_msb (0x03), out_y_lsb (0x04), out_z_msb (0x05), out_z_lsb (0x06) registers these registers contain the x-axis , y-axis, and z-axis 14-bit left-justified sa mple data expressed as 2's complement numbers. the sample data output registers store the current sample data if the fifo buffer func tion is disabled, but if the fifo buffer function is enabled the sample data output r egisters then point to the he ad of the fifo buffer which co ntains up to the previou s 32 x, y, and z data samples. the data is read out in the following order: xmsb, xlsb, ymsb, ylsb, zmsb, zlsb for ctrl_reg1[ f_read ] = 0, and xmsb, ymsb, zmsb for ctrl_reg1[ f_read ] = 1. similarly, for ctrl_reg1[ f_read ] = 1, only the msb's of the acceleration data are read out in the same axis order. if the ctrl_reg1[ f_read ] bit is set, auto-increment will skip over the lsb r egisters. this will shorten the data acquisition from 6 bytes to 3 bytes. if the lsb registers are directly addre ssed, the lsb information can still be read regardless of the ctrl_reg1[ f_read ] register setting. if the fifo data output regist er driver is enabled (f_setup[ f_mode ] > 00), register 0x01 points to the head of the fifo buffer, while registers 0x02, 0x03, 0x04, 0x05, 0x06 return a value of zero when read directly. the dr_status registers, out_x_msb, out_x_lsb, out_y_msb, out_y_l sb, out_z_msb, and out_z_lsb are located in the auto-incrementing address range of 0x00 to 0x06, allowing all of the acceleration data to be read in a single-bu rst read of 6 bytes starting at the out_x_msb register. table 46. out_x_msb register xd[13:6] table 47. out_x_lsb register xd[5:0] ? ? table 48. out_y_msb register yd[13:6] table 49. out_y_lsb register yd[5:0] ? ? table 50. out_z_msb register zd[13:6] table 51. out_z_lsb register zd[5:0] ? ?
FXLS8471Q sensors 42 freescale semiconductor, inc. 10.4 fifo 10.4.1 f_setup (0x09) register a fifo sample count exceeding the watermark event does not stop the fifo from accepting new data. the fifo upda te rate is dictated by the sele cted system odr. in active mode the odr is set by ctrl_reg1[ dr ] and when auto-sleep is active, the odr is set by ctrl_reg1[ aslp_rate ] bit fields. when data is read from the fifo buffer, the oldest sample data in the buffer is returned and also deleted from the front of the fifo, while the fifo sample count is decremented by one. it is assumed t hat the host application will use the i 2 c or spi burst read transactions to dump the fifo contents. if the fifo x, y, and z data is not completely read in one burst read transaction, the next read will start at the next fifo location x-axis data. if the y or z data is not read out in the same burst transactio n as the x-axis data, it will be lost. in trigger mode, the fifo is o perated as a circular buffer and will contain up to the 32 most recent acceleration data samples. the oldest sample is discarded and replaced by the current sa mple, until a fifo trigger event occurs. after a trigger event occ urs, the fifo will continue to accept samples only until overflowed, after which point the newest sample data is discarded. for more information on using the fifo buffer and the various fifo opera ting modes, please refer to freescale application note an4073. table 52. f_setup register f_mode[1:0] f_wmrk[5:0] 0 6b?000000 table 53. f_setup bit descriptions field description f_mode[1:0] (1)(2)(3) 1. this bit field can be written in active mode. 2. this bit field can be written in standby mode. 3. the fifo mode ( f_mode ) cannot be switched between operational modes (01, 10 and 11). fifo buffer operating mode. 00: fifo is disabled. 01: fifo contains the most recent samples when overflowed (c ircular buffer). oldest sample is discarded to be replaced by new sample. 10: fifo stops accepting new samples when overflowed. 11: fifo trigger mode. the fifo is flushed whenever the fifo is disabled, dur ing an automatic odr change (auto-wake/sleep), or on a transition from standby mode to active mode. disabling the fifo ( f_mode = 2?b00) resets the f_status[ f_ovf ], f_status[ f_wmrk_flag], f_status[ f_cnt ] status flags to zero. a fifo overflow event (that is, f_status[ f_cnt] = 32) will assert the f_status[f_ovf ] flag. f_wmrk[5:0] (2) fifo sample count watermark. these bits set the number of fifo samples required to tr igger a watermark interrupt. a fifo watermark event flag f_status[ f_wmk_flag ] is raised when fifo sample count f_status[ f_cnt] value is equal to or greater than the f_ wmrk watermark. setting the f_wmrk to 6?b000000 will disable the fifo watermark event flag generation. this field is also used to set the number of pre-trigger samples in trigger mode ( f_mode = 2?b11).
FXLS8471Q sensors freescale semiconductor, inc. 43 10.5 sensor data configuration 10.5.1 xyz_data_cfg (0x0e) register the xyz_data_cfg register is used to configure the desired accele ration full-scale range, and also to select whether the output data is passed through the high-pass filter. 10.6 high-pass filter 10.6.1 hp_filter_cutoff (0x0f) register high-pass filter cutoff frequency setting register. table 54. xyz_data_cfg register ? ? ? hpf_out ? ? fs[1:0] 000000 0 table 55. xyz_data_cfg bit descriptions field description hpf_out enable high-pass filter on acceleration output data 1: output data is high-pass filtered 0: high-pass filter is disabled. fs[1:0] accelerometer full-scale range selection. see table 56 table 56. fs[1] fs[0] full-scale range 0 0 0.244 mg/lsb 0 1 0.488 mg/lsb 1 0 0.976 mg/lsb 11 r e s e r v e d table 57. hp_filter_cutoff register ? ? pulse_hpf_byp pulse_lpf_en ? ? sel[1:0] 000000 0 table 58. hp_filter_cutoff bit descriptions field description pulse_hpf_byp bypass high-pass filter fo r pulse processing function 0: hpf enabled for pulse processing 1: hpf bypassed for pulse processing pulse_lpf_en enable low-pass filter fo r pulse processing function 0: lpf disabled for pulse processing 1: lpf enabled for pulse processing sel[1:0] hpf cutoff frequency selection see table 59 .
FXLS8471Q sensors 44 freescale semiconductor, inc. table 59. hp_filter_cutoff high-pass cutoff frequency (hz) odr (hz) sel = 2?b00 sel = 2?b01 normal lpln high resolution low power normal lpln high resolution low power 8 0 01 61 61 61 68888 4 0 01 61 61 688884 2 0 0881 644482 1 0 0441 622281 5 0221 611180 . 5 12.5 2 0.5 16 0.25 1 0.25 8 0.125 6.25 2 0.25 16 0.125 1 0.125 8 0.063 1.56 2 0.063 16 0.031 1 0.031 8 0.016 odr (hz) sel = 2?b10 sel = 2?b11 normal lpln high resolution low power normal lpln high resolution low power 8 0 044442222 4 0 044422221 2 0 022411120 . 5 100 1 1 4 0.5 0.5 0.5 2 0.25 50 0.5 0.5 4 0.25 0.25 0.25 2 0.125 12.5 0.5 0.125 4 0.063 0.25 0.063 2 0.031 6.25 0.5 0.063 4 0.031 0.25 0.031 2 0.016 1.56 0.5 0.016 4 0.008 0.25 0.008 2 0.004
FXLS8471Q sensors freescale semiconductor, inc. 45 10.7 portrait/landscape detection the FXLS8471Q is capable of detecting six orientations: landsc ape left, landscape right, portrait up, and portrait down with z-lockout feature as well as face up and face down orientation as shown in figures 13 , 14 and 15 . for more details on the meaning of the different user-configurable se ttings and for example code, please refer to freescale application note an4068. figure 13. illustration of z-tilt angle lockout transition . figure 14. illustration of landscape to portrait transition . figure 15. illustration of portrait to landscape transition normal 90 z-lock = 32.142 0 detection lockout region portrait landscape to portrait 90 trip angle = 60 0 landscape portrait portrait to landscape 90 trip angle = 30 0 landscape
FXLS8471Q sensors 46 freescale semiconductor, inc. 10.7.1 pl_status (0x10) register this status register can be read to get updated information on an y change in orientation by reading bit 7, or the specifics of the orientation by reading the other bits. for further understandin g of portrait up, portrait do wn, landscape left, landscape right , back and front orientations please refer to figure 15 . the interrupt is cleared when reading the pl_status register. the newlp bit is set to 1 after the first orientation detection af ter a standby to active transition, and whenever a change in lo, bafro , or lapo occurs. the newlp bit is cleared anytime the pl_status register is read. lapo, bafro and lo continue to change when newlp is set. the current orientation is locke d if the absolute value of the acceleration experienced on any of the three axes is greater than 1.25 g . table 60. pl_status register newlp lo ? ? ? lapo[1] lapo[0] bafro 0 0000000 table 61. pl_status bit descriptions field description newlp landscape/portrait status change flag. 0: no change 1: bafro and/or lapo and/or z-tilt lockout value has changed lo z-tilt angle lockout. 0: lockout condition has not been detected. 1: z-tilt lockout trip angle has been exceeded. lockout condition has been detected. lapo[1:0] (1) 1. the default powerup state is bafro (undefined), lapo (undefined), and no lockout for orientation function. landscape/portrait orientation. 00: portrait up: equipment standing vertically in the normal orientation 01: portrait down: equipment standing vertically in the inverted orientation 10: landscape right: equipment is in landscape mode to the right 11: landscape left: equipment is in landscape mode to the left. bafro back or front orientation. 0: front: equipment is in the front facing orientation. 1: back: equipment is in the back facing orientation.
FXLS8471Q sensors freescale semiconductor, inc. 47 10.7.2 pl_cfg (0x11) register this register enables the portrait/landscape function and sets the behavior of the debounce counter. 10.7.3 pl_count (0x12) register this register sets the debounce count for the orientation stat e transition. the minimum debounce latency is determined by the system odr value and the value of the pl_count register. any change to the system odr or a transition from active to standby (or vice-versa) resets the internal landscape/portrait internal debounce counters. table 62. pl_cfg register d b c n t mp l _ e n?????? 10000000 table 63. pl_cfg bit descriptions field description dbcntm debounce counter mode selection. 0: decrements debounce whenever condition of interest is no longer valid. 1: clears counter whenever condition of interest is no longer valid. pl_en portrait/landscape detection enable. 0: portrait/landscape detection is disabled. 1: portrait/landscape detection is enabled. table 64. pl_count register dbnce[7:0] 8?b00000000 table 65. pl_count relationship with the odr odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25 400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5 200 1.28 1.28 0.638 1.28 5 5 2.5 5 100 2.55 2.55 0.638 2.55 10 10 2.5 10 50 5.1 5.1 0.638 5.1 20 20 2.5 20 12.5 5.1 20.4 0.638 20.4 20 80 2.5 80 6.25 5.1 20.4 0.638 40.8 20 80 2.5 160 1.56 5.1 20.4 0.638 40.8 20 80 2.5 160
FXLS8471Q sensors 48 freescale semiconductor, inc. 10.7.4 pl_bf_zcomp (0x13) register back/front and z-tilt angle compensation register table 66. pl_bf_zcomp register bkfr[1:0] ? ? ? zlock[2:0] 2?b10 0 0 0 3?b100 table 67. pl_bf_zcomp bit descriptions field description zlock[2:0] z-lock angle threshold. range is from approximatel y 13 to 44. step size is approximately 4. see table 68 for more information. default value: 0x04 28 . maximum value: 0x07 ~44 . bkfr[1:0] back/front trip angle threshold. see table 69 for more information. default: 2?b10 70 . step size is 5. range: (65 to 80). table 68. z-lockout angle definitions zlock resultant angle (min) for positions between landscape and portrait resultant angle (max) for ideal landscape or portrait 0x00 13.6 14.5 0x01 17.1 18.2 0x02 20.7 22.0 0x03 24.4 25.9 0x04 28.1 30.0 0x05 32.0 34.2 0x06 36.1 38.7 0x07 40.4 43.4 table 69. back/front orientation definitions bkfr back front transition front back transition 00 z < 80 or z > 280 z > 100 and z < 260 01 z < 75 or z > 285 z > 105 and z < 255 10 z < 70 or z > 290 z > 110 and z < 250 11 z < 65 or z > 295 z > 115 and z < 245
FXLS8471Q sensors freescale semiconductor, inc. 49 10.7.5 pl_ths_reg (0x14) register portrait to landscape trip threshold registers. 10.8 freefall and motion detection the freefall/motion detection blo ck can be configured to detect low- g (freefall) or high- g (motion) events utilizing the a_ffmt_cfg[ a_ffmt_oae ] bit. in low- g detect mode (a_ffmt_cfg[ a_ffmt_oae ] = 0) a low- g condition will need to occur on all enabled axes (ex. x, y and z) for the a_ffmt_src[ a_ffmt_ea ] bit to be affected. and, in high- g detect mode (a_ffmt_cfg[ a_ffmt_oae ] = 1) a high- g condition occurring in any of the enabled axes (ex. x, y or z) will suffice to affect the a_ffmt_src[ a_ffmt_ea ] bit. the detection threshold(s) are programed in register 0x17 (a_ffmt_ths) for comm on threshold operation, and 0x73-0x78 (a_ffmt_ths_x/y/z) for individual axis threshold operation. a_ffmt_cfg[ a_ffmt_ele ] bit determines the behavior of a_ffmt_src[ a_ffmt_ea ] bit in response to t he desired acceleration event (low-g/high-g). when a_ffmt_cfg[ a_ffmt_ele ] = 1, the freefall or moti on event is latched and the table 70. pl_ths_reg register pl_ths[4:0] hys[2:0] 5?b01000 3?b100 table 71. threshold angle lookup table pl_ths[4:0] value threshold angle (approx.) 0x07 15 0x09 20 0x0c 30 0x0d 35 0x0f 40 0x10 45 0x13 55 0x14 60 0x17 70 0x19 75 table 72. trip angles versus hysteresis settings hys[2:0] value landscape to portrait trip angle portrait to landscape trip angle 0 45 45 1 49 41 2 52 38 3 56 34 4 59 31 5 62 28 6 66 24 7 69 21 table 73. portrait/landscape ideal orientation definitions position description pu y ~ -1 g, x ~ 0 pd y ~ +1 g, x ~ 0 lr y ~ 0, x ~ +1 g ll y ~ 0, x ~ -1 g
FXLS8471Q sensors 50 freescale semiconductor, inc. a_ffmt_src[ a_ffmt_ea ] flag can only be cleared by reading the a_ffmt_src register. when a_ffmt_cfg[ a_ffmt_ele ] = 0, freefall or motion events are not latched , and the a_ffmt_src[ a_ffmt_ea ] bit reflects the real-time status of the event detection. a_ffmt_ths[ a_ffmt_dbcntm ] bit determines the debounce filtering behavior of the logic which sets the a_ffmt_src[ a_ffmt_ea ] bit. see figure 17 for details. it is possible to enable/disable each axis used in the freefall/motion detection func tion by configuring bits a_ffmt_cfg[ a_ffmt_xefe ], a_ffmt_cfg[ a_ffmt_yefe ], and a_ffmt_cfg[ a_ffmt_zefe ]. the freefall/motion detection function has the option to use a common 7-bit unsigned th reshold for each of the x, y, z axes, or individual unsigned 13-bit thresholds for each axis. when a_ffmt_ths_x_msb[ a_ffmt_ths_xyz_en ] = 0, the 7-bit threshold value stored in register 0x17 is used as a co mmon 7-bit threshold for the x, y, and z axes. when a_ffmt_ths_xyz_en = 1, each axis may be programmed with an individual 13-bit thres hold (stored in the a_ffmt_x/y/z msb and lsb registers). 10.8.1 a_ffmt_cfg (0x15) register freefall/motion configuration register. table 74. a_ffmt_cfg register a_ffmt_ele a_ffmt_oae a_ffmt_zefe a_ffmt_yefe a_ffmt_xefe ? ? ? 000000 00 table 75. a_ffmt_cfg bit descriptions field description a_ffmt_ele a_ffmt_ele denotes whether the enabled event flag will be latched in the a_ffmt_src register or the event flag status in the a_ffmt_src will indicate the real-time status of the event. if a_ffmt_ele bit is set to a logic ?1?, then the event flags are frozen when the a_ffmt_ea bit gets set, and are cleared by reading the a_ffmt_src source register. default value: 0 0: event flag latch disabled 1: event flag latch enabled a_ffmt_oae a_ffmt_oae bit allows the selection between motion (logical or combination of high- g x, y, z-axis event flags) and freefall (logical and combination of low- g x, y, z-axis event flags) detection. motion detect/freefall detect logic selection. default value: 0 (freefall flag) 0: freefall flag (logical and combination of low- g x, y, z-axis event flags) 1: motion flag (logical or combination of high- g x, y, z event flags) a_ffmt_zefe a_ffmt_zefe enables the detection of a high- or low- g event when the measured accelerati on data on z-axis is above/below the threshold set in the a_ffmt_ths register. if the a_ffmt_ele bit is set to logic ?1? in the a_ffmt_cfg register, new event flags are blocked from updating the a_ffmt_src register. default value: 0 0: event detection disabled 1: raise event flag on measured z-ax is acceleration above/below threshold. a_ffmt_yefe a_ffmt_yefe enables the detection of a high- or low- g event when the measured acceleration data on y-axis is above/below the threshold set in the a_ffmt_ths register. if the a_ffmt_ele bit is set to logic ?1? in the a_ffmt_cfg register, new event flags are blocked from updating the a_ffmt_src register. default value: 0 0: event detection disabled 1: raise event flag on measured y-axis acceleration above/below threshold. a_ffmt_xefe a_ffmt_xefe enables the detection of a high- or low-g event when the measured accelerati on data on x-axis is above/below the threshold set in the a_ffmt_ths register. if the a_ffmt_ele bit is set to logic ?1? in the a_ffmt_cfg register, new event flags are blocked from updating the a_ffmt_src register. default value: 0 0: event detection disabled 1: raise event flag on measured x-axis acceleration above/below threshold.
FXLS8471Q sensors freescale semiconductor, inc. 51 10.8.2 a_ffmt_src (0x16) register freefall/motion source register. read-only register. this register keeps track of the acceleration event whic h is triggering (or has triggered, in case of a_ffmt_cfg[ a_ffmt_ele ] = 1) the event flag. in particular a_ffmt_src[ a_ffmt_ea ] is set to a logic ?1? when the logical combination of acceleration event flags specified in a_ffmt_cfg register is true. this bit is used in combination with the values in ctrl_reg4[ int_en_ffmt ] and ctrl_reg5[ int_cfg_ffmt ] register bits to generate the freefall/motion interrupts. table 76. a_ffmt_src register a_ffmt_ea ? a_ffmt_zhe a_ffmt_zhp a_ffmt_yhe a_ffmt_yhp a_ffmt_xhe a_ffmt_xhp 00000000 table 77. a_ffmt_src bit descriptions field description a_ffmt_ea event active flag. default value: 0 0: no event flag has been asserted 1: one or more event flag has been assert ed. see the description of the a_ffmt_cfg[ a_ffmt_oae ] bit to determine the effect of the 3-axis event flags on the a_ffmt_ea bit. a_ffmt_zhe z-high event flag. default value: 0 0: event detected 1: z-high event has been detected this bit always reads zero if the a_ffmt_zefe control bit is set to zero a_ffmt_zhp z-high event polarity flag. default value: 0 0: z event was positive g 1: z event was negative g this bit read always zero if the a_ffmt_zefe control bit is set to zero a_ffmt_yhe y-high event flag. default value: 0 0: no event detected 1: y-high event has been detected this bit read always zero if the a_ffmt_yefe control bit is set to zero a_ffmt_yhp y-high event polarity flag. default value: 0 0: y event detected was positive g 1: y event was negative g this bit always reads zero if the a_ffmt_yefe control bit is set to zero a_ffmt_xhe x-high event flag. default value: 0 0: no event detected 1: x-high event has been detected this bit always reads zero if the a_ffmt_xefe control bit is set to zero a_ffmt_xhp x-high event polarity flag. default value: 0 0: x event was positive g 1: x event was negative g this bit always reads zero if the a_ffmt_xefe control bit is set to zero
FXLS8471Q sensors 52 freescale semiconductor, inc. 10.8.3 a_ffmt_ths (0x17), a_ffmt_ ths_x_msb (0x73), a_ffmt_ths_x_lsb (0x74), a_ffmt_ths_y_msb (0x75), a_ffmt_ths _y_lsb (0x76), a_ffmt_ths_z_msb (0x77), a_ffmt_ths_z_lsb (0x78) registers freefall/motion detection threshold registers. table 78. a_ffmt_ths (0x17) register a_ffmt_dbcntm ths[6:0] 0 7?b0000000 table 79. a_ffmt_ths (0x17) bit descriptions field description a_ffmt_dbcntm the asic uses a_ffmt_dbcntm to set the acceleration ffmt debounce counter clear mode independent of the value of the a_ffmt_ths_xyz_en . a_ffmt_dbcntm bit configures the way in which the debounce counter is reset when the inertial event of interest is momentarily not true. when a_ffmt_dbcntm bit is a logic ?1?, the debounce counter is cleared to 0 whenever the inertial event of interest is no longer true (part b, figure 17 ) while if the a_ffmt_dbcntm bit is set to logic ?0? the debounce counter is decremented by 1 whenever the inertial event of interest in longer true (part c, figure 17 ) until the debounce counter reaches 0 or the inertial event of interest become active. the decrementing of the debounce counter acts to filter out irregular spurious events which might impede the correct detection of inertial events. ths[6:0] freefall/motion detection threshold: default value: 7?b0000000. resolution is fixed at 63 mg/lsb. table 80. a_ffmt_ths_x_msb (0x73) register a_ffmt_ths_xyz_en a_ffmt_ths_x[12:6] 0 7?b0000000 table 81. a_ffmt_ths_x_msb (0x73) bit descriptions field description a_ffmt_ths_xyz_en for a_ffmt_ths_xyz_en = 0 the asic uses the ffmt_ths [6:0] value located in register x17[6:0] as a common threshold for the x, y, and z-axis acceleration detection. the common unsigned 7-bit acceleration threshold has a fixed resolution of 63 mg/lsb, with a range of 0-127 counts. for a_ffmt_ths_xyz_en = 1 the asic ignores the common 7-bit g_ffmt_ths value located in register x17 when executing the ffmt function, and the following independent threshold values are used for each axis: a_ffmt_ths_x_msb and a_ffmt_ths_x_lsb are us ed for the x-axis acceleration threshold, a_ffmt_ths_y_msb and a_ffmt_ths_y_lsb for the y-axis acceleration threshold, a_ffmt_ths_z_msb and a_ffmt_ths_z_lsb for the z-axis acceleration threshold. the a_ffmt_ths_x/y/z thresholds are 13-bit unsigned values that have the same resolution as the accelerometer output data determined by xyz_data_cfg fs [1:0]. the a_ffmt_ths_xyz_en and a_ffmt_trans_ths_en bits must not be enabled simultaneously. a_ffmt_ths_x[12:6] 7-bit msb of x-axis acceleration threshold table 82. a_ffmt_ths_x_lsb (0x74) register a_ffmt_ths_x[5:0] ? ? 6?b000000 0 0 table 83. a_ffmt_ths_y_msb (0x75) register a_ffmt_trans_ths_en a_ffmt_ths_y[12:6] 0 7?b0000000 table 84. a_ffmt_ths_y_lsb (0x76) register a_ffmt_ths_y[5:0] ? ? 6?b000000 0 0
FXLS8471Q sensors freescale semiconductor, inc. 53 figure 16. a_ffmt_ths high and low- g level a_ffmt_ths contains the unsigned 7-bit threshold value used by the freefall/motion detection f unctional block and is used to detect either low- g (freefall) or high- g (motion) events depending on the setting of g_ffmt_cfg[ f_ffmt_oae ]. if g_ffmt_oae = 0, the event is detected when the absolute value of all the enabled axes are below the threshold value. when g_ffmt_oae = 1, the event is detected when the absolute value of any of the enabled axes is above the threshold value (see figure 16 for an illustration of the freefall/motion event detection thresholds). if a_ffmt_ths_x_msb[ a_ffmt_ths_xyz_en ] = 1, the behavior is identical, except that each axis may be programmed with an individual 13-bit thres hold (stored in the a_ffmt_x/y/z msb and lsb registers). 10.8.4 a_ffmt_count (0x18) register debounce count register for freefall/motion detection events this register sets the number of debounce counts for accelerati on sample data matching the user-programmed conditions for either a freefall or motion detection event required before the interrupt is triggered. when the internal debounce counter reaches the a_ffmt_count value a freefall/motion event flag is set. the debounce counter will never increase beyond the a_ffmt_count value. th e time step used for the debounce sample count depends on the odr chosen (see table 89 ). table 85. a_ffmt_ths_z_msb (0x77) register ? a_ffmt_ths_z[12:6] 0 7?b0000000 table 86. a_ffmt_ths_z_lsb (0x78) register a_ffmt_ths_z[5:0] ? ? 6?b000000 0 0 table 87. a_ffmt_count register a_ffmt_count[7:0] 8?b00000000 table 88. a_ffmt_count bit description field description a_ffmt_count[7:0] a_ffmt_count defines the minimum number of debounce sample count s required for the detection of a freefall or motion event. a_ffmt_ths[ ffmt_dbcntm ] determines the behavior of the counter when the condition of interest is momentarily not true. +full scale high- g positive threshold low- g threshold high- g negative threshold -full scale x, y, z high- g region x, y, z high- g region x, y, z low- g region negative positive acceleration acceleration (motion or of enabled axes) (freefall - and of enabled axes) (motion - or of enabled axes)
FXLS8471Q sensors 54 freescale semiconductor, inc. for example, an odr of 100 hz and a a_ ffmt_count value of 15 would result in minimum debounce response time of 150 ms. figure 17. behavior of the a_ffmt debounce co unter in relation to the a_ffmt_dbcntm setting table 89. a_ffmt_count re lationship with the odr odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution lp 800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25 400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5 200 1.28 1.28 0.638 1.28 5 5 2.5 5 100 2.55 2.55 0.638 2.55 10 10 2.5 10 50 5.1 5.1 0.638 5.1 20 20 2.5 20 12.5 5.1 20.4 0.638 20.4 20 80 2.5 80 6.25 5.1 20.4 0.638 40.8 20 80 2.5 160 1.56 5.1 20.4 0.638 40.8 20 80 2.5 160 low-g event on count threshold ea all 3-axis ff counter low- g event on count threshold (a) all 3-axis debounce counter low- g event on count threshold ea all 3-axis a_ffmt_dbcntm = 1 (b) ea a_ffmt_dbcntm = 1 (c) debounce counter
FXLS8471Q sensors freescale semiconductor, inc. 55 10.9 accelerometer vecto r-magnitude function the accelerometer vector-magnitude function is an inertial event detection function available to assist host so ftware algorithm s in detecting motion events. if > a_vecm_ths for a time period greater than the value stored in a_vecm_cnt, the vector-magnitude change event flag is triggered. a_x_out, a_y_out, and a_z_out are the current accelerometer output values, and a_x_ref, a_y_ref, and a_z_ref are the reference values stored internally in the asic for each axis or in a_vecm_init_x/y/ z registers if a_vecm_cfg[ a_vecm_initm ] is set. please note that the x_ref, y_ref, and z_ref values are not dire ctly visible to the host application through the register inter face. please refer to freescale application note 4458. 10.9.1 a_vecm_cfg (0x5f) register table 90. a_vecm_cfg register ? a_vecm_ele a_vecm_initm a_vecm_updm a_vecm_en ? ? ? 000 0 0000 table 91. a_vecm_cfg bit descriptions field description a_vecm_ele control bit a_vecm_ele defines the event latch enable mode. event latching is disabled for a_vecm_ele = 0. in this case, the vector-magnitude interrupt flag is in updated real -time and is cleared when the condition for triggering the interrupt is no longer true. the setting and clearing of the event flag is controlled by the a_vecm_cnt register?s programmed debounce time. for a_vecm_ele = 1, the interrupt flag is latched in and held unti l the host application reads the int_source register (0x0c). a_vecm_initm control bit a_vecm_initm defines how the initial reference values (x_ref, y_ref, and z_ref) are chosen. for a_vecm_initm = 0 the function uses the current x/y/z accelerometer output data at the time when the vector magnitude function is enabled. for a_vecm_initm = 1 the function uses the data from a_vecm_init_x /y/z registers as the initial reference values. a_vecm_updm control bit a_vecm_updm defines how the reference values are upd ated once the vector-magnitude function has been triggered. for a_vecm_updm = 0, the function updates the reference value with the current x, y, and z accelerometer output data values. for a_vecm_updm = 1, the function does not update the reference values when the interrupt is triggered. instead the function continues to use the reference values that were loaded when the function was enabled. if both a_vecm_initm and a_vecm_updm are set to logic ?1?, the host software can manual ly update the reference values in real time by writing to the a_vecm_initx,y,z registers. a_vecm_en the accelerometer vector-magnitu de function is enabled by setting a_vecm_en = 1, and disabled by clearing this bit (default). the reference values are loaded with either the curr ent x/y/z acceleration values or the values stored in the a_vecm_init_x/y/z registers, depending on the state of the a_vecm_initm bit. note: the vector-magnitude function will only perform correctly up to a maximum odr of 400 hz. a_x_out a_x_ref ? () 2 a_y_out a_y_ref ? () 2 a_z_out a_z_ref ? () 2 ++
FXLS8471Q sensors 56 freescale semiconductor, inc. 10.9.2 a_vecm_ths_msb (0x60) register 10.9.3 a_vecm_ths_lsb (0x61) register 10.9.4 a_vecm_cnt (0x62) register the debounce timer period is determined by the odr selected in ctrl_reg1; it is equal to the number indicated in a_vecm_cnt register times 1/odr. for example, a value of 16 in a_vecm_cnt with an odr setting of 400 hz will result in a debounce period of 40 ms. table 92. a_vecm_ths_msb register a_vecm_dbcntm ? ? a_vecm_ths[12:8] 0 0 0 5?b00000 table 93. a_vecm_ths_msb bit descriptions field description a_vecm_dbcntm control bit a_vecm_dbcntm defines how the debounce timer is reset when the condition for triggering the interrupt is no longer true. when a_vecm_dbcntm = 0 the debounce counter is decremented by 1 when the vector-magnitude result is below the programmed threshold value. when a_vecm_dbcntm = 1 the debounce counter is cleared when the vector-magnitude result is below the programmed threshold value. a_vecm_ths[12:8] five msbs of the 13-bit unsigned a_vecm_ths value. the resolution is equal to the selected accelerometer resolution set in xyz_data_cfg[ fs ] table 94. a_vecm_ths_lsb register a_vecm_ths[7:0] 8?b00000000 table 95. a_vecm_cnt register a_vecm_cnt[7:0] 8?b00000000 table 96. a_vecm_cnt bit description field description a_vecm_cnt[7:0] vector-magnit ude function debounce count value.
FXLS8471Q sensors freescale semiconductor, inc. 57 10.9.5 a_vecm_initx_msb (0x63) register 10.9.6 a_vecm_initx_lsb (0x64) register 10.9.7 a_vecm_inity_msb (0x65) register 10.9.8 a_vecm_inity_lsb (0x66) register 10.9.9 a_vecm_initz_msb (0x67) register table 97. a_vecm_initx_msb register ? ? a_vecm_initx[13:8] 0 0 6?b000000 table 98. a_vecm_initx_msb bit description field description a_vecm_initx[13:8] most significant 6 bits of the signed 14-bit initial x-axis value to be used as ref_x when a_vecm_cfg[ a_vecm_initm ]=1. the resolution is determined by t he settings made in xyz_data_cfg[ fs ], and is equal to the accelerometer resolution. table 99. a_vecm_initx_lsb register a_vecm_initx[7:0] 8?b00000000 table 100. a_vecm_initx_lsb bit description field description a_vecm_initx[7:0] lsb of the signed 14-bit initial x-axis value to be used as ref_x when a_vecm_cfg[ a_vecm_initm ] = 1. the resolution is determined by the settings made in xyz_data_cfg[ fs ], and is equal to the accelerometer resolution. table 101. a_vecm_inity_msb register ? ? a_vecm_inity[13:8] 0 0 6?b000000 table 102. a_vecm_inity_msb bit description field description a_vecm_inity[13:8] most significant 6 bits of the signed 14-bit initia l y-axis value to be used as ref_y when a_vecm_cfg[ a_vecm_initm ] = 1. the resolution is determined by the settings made in xyz_data_cfg[ fs ], and is equal to the accelerometer resolution. table 103. a_vecm_inity_lsb register a_vecm_inity[7:0] table 104. a_vecm_inity_lsb bit description field description a_vecm_inity[7:0] lsb of the signed 14-bit initial y-axis value to be used as ref_y when a_vecm_cfg[ a_vecm_initm ] = 1. the resolution is determined by the settings made in xyz_data_cfg[ fs ], and is equal to the accelerometer resolution. table 105. a_vecm_initz_msb register ? ? a_vecm_initz[13:8] 0 0 6?b000000
FXLS8471Q sensors 58 freescale semiconductor, inc. 10.9.10 a_vecm_initz_lsb (0x68) register 10.10 transient (ac) a cceleration detection the transient detection function is similar to the freefall/moti on detection function with the e xception that a high-pass filter can be used to eliminate the dc offset from the acceleration data. th ere is an option to disable the hi gh-pass filter, which causes th e transient detection function to work in a similar manner to the motion detection function. the transient detection function can be configured to signal an interrupt when the high-pass filtered acceleration delta values for any of the enabled axes exceeds the threshold programmed in transient_ths for the debounce time programmed in transient_count. for more information on how to use and configure the transient detection function please refer to freescale application note an4461. 10.10.1 transient_cfg (0x1d) register table 106. a_vecm_initz_msb bit description field description a_vecm_initz[13:8] most significant 6 bits of the signed 14-bit initial z-axis value to be used as ref_z when a_vecm_cfg[ a_vecm_initm ] = 1. the resolution is determined by the settings made in xyz_data_cfg[ fs ], and is equal to the accelerometer resolution. table 107. a_vecm_initz_lsb register a_vecm_initz[7:0] 8?b00000000 table 108. a_vecm_initz_lsb bit description field description a_vecm_initz[7:0] lsb of the signed 14-bit initial z-axis val ue to be used as ref_z when a_vecm_cfg[ a_vecm_initm ] = 1. the resolution is determined by the settings made in xyz_data_cfg[ fs ], and is equal to the accelerometer resolution. table 109. transient_ cfg register ? ? ? tran_ele tran_zefe tran_yefe tran_xefe tran_hpf_byp 0000000 0 table 110. transient_ cfg bit descriptions field description tran_ele transient event flag latch enable. default value: 0 0: event flag latch disabled: the transient interrupt flag reflects the real-time status of the function. 1: event flag latch enabled: the transient interrupt event flag is latched an d a read of the transient_src register is required to clear the event flag. tran_zefe z-axis transient event flag enable. default value: 0 0: z-axis event detection disabled 1: z-axis event detection enabled. raise event flag on z-axis acceleration value greater than threshold. tran_yefe y-axis transient event fl ag enable. default value: 0 0: y-axis event detection disabled 1: y-axis event detection enabled. raise event flag on y-axis acceleration value greater than threshold. tran_xefe x-axis transient event fl ag enable. default value: 0 0: x-axis event detection disabled 1: x-axis event detection enabled. ra ise event flag on x-axis accelera tion value greater than threshold. tran_hpf_byp transient function high-pass filter bypass. default value: 0 0: high-pass filter is applied to accelerometer data input to the transient function. 1: high-pass filter is not applied to accelerometer data input to the transient function.
FXLS8471Q sensors freescale semiconductor, inc. 59 10.10.2 transient_src (0x1e) register transient event flag source register. this register provides the event status of the enabled axes and polarity (directional) information. when transient_cfg[ tran_ele ] = 1, the transient_src event flag(s) and polarity bits are latched when the interrupt event is triggered, allowing the host application to determine whic h event flag(s) originally triggered the interrupt. when transient_cfg[ tran_ele ] = 0, events which occur after the event that originally triggered the interr upt will update the flag and polarity bits, but once set, the flags can only be cleared by reading the transient_src register. table 111. transient_ cfg register ? tran_ea tran_zef tran_zpol tran_yef tran_ypol tran_xef trans_xpol 00000000 table 112. transient_src bit descriptions field description tran_ea transient event active flag. default value: 0 0: no transient event active flag has been asserted. 1: one or more transient event active flags has been asserted. tran_zef z-axis transient event acti ve flag. default value: 0 0: z-axis event flag is not active. 1: z-axis event flag is active; z-axis acceleration has exceeded the programm ed threshold for the debounce time specified in trans_count. tran_zpol z-axis event flag polarity. 0: z-axis event was above positive threshold value. 1: z-axis event was below negative threshold value. tran_yef y-axis transient event acti ve flag. default value: 0 0: y-axis event flag is not active. 1: y-axis event flag is active; y-axis acceleration has exceeded the programmed th reshold for the debounce time specified in trans_count. tran_ypol y-axis event flag polarity. 0: y-axis event was above positive threshold value. 1: y-axis event was below negative threshold value. tran_xef x-axis transient event acti ve flag. default value: 0 0: x-axis event flag is not active. 1: x-axis event flag is acti ve; x-axis acceleration has exceeded the programmed threshold for the debounce time specified in trans_count. tran_xpol x-axis event flag polarity. 0: x-axis event was above positive threshold value. 1: x-axis event was below negative threshold value.
FXLS8471Q sensors 60 freescale semiconductor, inc. 10.10.3 transient_ths (0x1f) register the transient_ths register determines the debounce counte r behavior and also sets the transient event detection threshold.it is possible to use a_ffmt_ths_x/y/z msb and lsb re gisters to set transient acceleration thresholds for individual axes using the a_ffmt_trans_ths_en bit in a_ffmt_ths_y_msb register. the tr_ths[6:0] value is a 7-bit unsigned number, wit h a fixed resolution of 63 mg/lsb corresponding to a 8 g measurement range. the resolution does not change with the full-scale range setting made in xyz_data_cfg[ fs ]. if ctrl_reg1[ lnoise ] = 1, the measurement range is fixed at 4 g , regardless of the settings made in xyz_data_cfg. 10.10.4 transient_count (0x20) register the transient_count register sets the mi nimum number of debounce counts needed to trigger the transient event interrupt flag when the measured acceleration value exceeds the threshold set in transient_ths for any of the enabled axes. the time step for the transient detection debounce counter is set by the value of the system odr and power mode as shown in table 117 . an odr of 100 hz and a transient_count value of 15, when accelerometer osr is set to normal using ctrl_reg2, would result in minimum debounce response time of 150 ms. table 113. transient_ths register tr_dbcntm tr_ths[6:0] 0 7?b0000000 table 114. transient_ths bit descriptions field description tr_dbcntm debounce counter mode selection. 0: decrements debounce counter when the transient event condition is not true during the current odr period. 1: clears debounce counter when the transient event c ondition is not true during the current odr period. tr_ths[6:0] transient event threshold. this register has a resolution of 63 mg/lsb regardless of the full-scale range setting made in xyz_data_cfg[ fs ]. if ctrl_reg1[ lnoise ] = 1, the maximum acceleration measurement range is 4 g. table 115. transient _count register tr_count[7:0] 8?b00000000 table 116. transient_c ount bit description field description tr_count[7:0) transient function debounce count value. table 117. transient_count relationship with the odr odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25 400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5 200 1.28 1.28 0.638 1.28 5 5 2.5 5 100 2.55 2.55 0.638 2.55 10 10 2.5 10 50 5.1 5.1 0.638 5.1 20 20 2.5 20 12.5 5.1 20.4 0.638 20.4 20 80 2.5 80 6.25 5.1 20.4 0.638 40.8 20 80 2.5 160 1.56 5.1 20.4 0.638 40.8 20 80 2.5 160
FXLS8471Q sensors freescale semiconductor, inc. 61 10.11 pulse detection 10.11.1 pulse_cfg (0x21) register this register configures the pulse event detection function. table 118. pulse_cfg register pls_dpa pls_ele pls_zdpefe p ls_zspefe pls_ydpef e pls_yspefe pls_xdpefe pls_xspefe 00000000 table 119. pulse_cfg bit descriptions field description pls_dpa double-pulse abort. 0: double-pulse detection is not aborted if the start of a pulse is detected during the ti me period specified by the pulse_ltcy register. 1: setting the pls_dpa bit momentarily suspends the double-tap detection if the start of a pulse is detected during the time period specified by the pulse_ltcy register and the pulse ends before the end of the time period specified by the pulse_ltcy register. pls_ele pulse event flag latch enable. when enabled, a read of the pulse_src register is needed to clear the event flag. 0: event flag latch disabled 1: event flag latch enabled pls_zdpefe event flag enable on double-pu lse event on z-axis. 0: event detection disabled 1: raise event flag on detection of double-pulse event on z-axis pls_zspefe event flag enable on single- pulse event on z-axis. 0: event detection disabled 1: raise event flag on detection of single-pulse event on z-axis pls_ydpefe event flag enable on double-pu lse event on y-axis. 0: event detection disabled 1: raise event flag on detection of double-pulse event on y-axis pls_yspefe event flag enable on single- pulse event on y-axis. 0: event detection disabled 1: raise event flag on detection of single-pulse event on z-axis. pls_xdpefe event flag enable on double-pulse event on x-axis. 0: event detection disabled 1: raise event flag on detection of double-pulse event on x-axis. pls_xspefe event flag enable on single- pulse event on x-axis. 0: event detection disabled 1: raise event flag on detection of single-pulse event on x-axis.
FXLS8471Q sensors 62 freescale semiconductor, inc. 10.11.2 pulse_src (0x22) register this register indicates the status bits for the pulse detection function. 10.11.3 pulse_thsx (0x23) register the pulse_thsx, pulse_thsy a nd pulse_thsz registers defi ne the thresholds used by th e system to start the pulse- event detection procedure. threshold values for each axis are unsigned 7-bit numbers with a fixed resolution of 0.063 g /lsb, corresponding to an 8 g acceleration full-scale range. the full-scale range is fixed at 8 g for the pulse detection function, regardless of the settings made in xyz_data_cfg[ fs ]. table 120. pulse_src register pls_src_ea pls_src_axz pls_src_axy pls_src_axx p ls_src_dpe pls_src_polz p ls_src_poly pls_src_polx table 121. pulse_src bit descriptions field description pls_src_ea event active flag. 0: no interrupt has been generated 1: one or more interrupt events have been generated pls_src_axz z-axis event flag. 0: no interrupt. 1: z-axis event has occurred pls_src_axy y-axis event flag. 0: no interrupt. 1: y-axis event has occurred pls_src_axx x-axis event flag. 0: no interrupt. 1: x-axis event has occurred. pls_src_dpe double pulse on first event. 0: single-pulse event triggered interrupt. 1: double-pulse event triggered interrupt. pls_src_polz pulse polarity of z-axis event. 0: pulse event that triggered interrupt was positive. 1: pulse event that triggered interrupt was negative. pls_src_poly pulse polarity of y-axis event. 0: pulse event that triggered interrupt was positive. 1: pulse event that triggered interrupt was negative. pls_src_polx pulse polarity of x-axis event. 0: pulse event that triggered interrupt was positive. 1: pulse event that triggered interrupt was negative. table 122. pulse_thsx register ? pls_thsx[6:0] 0 7?b0000000 table 123. pulse_thsx bit description field description pls_thsx[6:0] pulse threshold for x-axis.
FXLS8471Q sensors freescale semiconductor, inc. 63 10.11.4 pulse_thsy (0x24) register 10.11.5 pulse_thsz (0x25) register 10.11.6 pulse_tmlt (0x26) register minimum time step for the pulse-time limit is defined in tables 130 and 131 . maximum time for a given odr is ?minimum time step x 255?. table 124. pul se_thsy register ? pls_thsy[6:0] 0 7?b0000000 table 125. pulse_thsy bit description field description pls_thsy[6:0] pulse threshold for y-axis. table 126. pulse_thsz register ? pls_thsz[6:0] 0 7?b0000000 table 127. pulse_thsz bit description field description pls_thsz[6:0] pulse threshold for z-axis. table 128. pulse_tmlt register pls_tmlt[7:0] 8?b00000000 table 129. pulse_tmlt bit description field description pls_tmlt[7:0] pls_tmlt [7:0] defines the maximum time interval that can elap se between the start of the acceleration on the selected channel exceeding the specified thre shold and the end when the channel accele ration goes back below the specified threshold. table 130. time step for pulse_tmlt with hp_filter_cutoff[ pls_hpf_en ] = 1 odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.319 0.319 0.319 0.319 1.25 1.25 1.25 1.25 400 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5 200 1.28 1.28 0.638 1.28 5 5 2.5 5 100 2.55 2.55 0.638 2.55 10 10 2.5 10 50 5.1 5.1 0.638 5.1 20 20 2.5 20 12.5 5.1 20.4 0.638 20.4 20 80 2.5 80 6.25 5.1 20.4 0.638 40.8 20 80 2.5 160 1.56 5.1 20.4 0.638 40.8 20 80 2.5 160
FXLS8471Q sensors 64 freescale semiconductor, inc. therefore an odr setting of 400 hz, when accelerometer osr is set to normal using ctrl_reg2, would result in a maximum pulse-time limit of (0.625 ms * 255) = 159 ms. 10.11.7 pulse_ltcy (0x27) register minimum time step for the pulse latency is defined in tables 134 and 135 . maximum time is ?(time step @ odr and power mode) x 255?. table 131. time step for pulse_tmlt with hp_filter_cutoff[ pls_hpf_en ] = 0 odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.159 0.159 0.159 0.159 0.625 0.625 0.625 0.625 400 0.159 0.159 0.159 0.319 0.625 0.625 0.625 1.25 200 0.319 0.319 0.159 0.638 1.25 1.25 0.625 2.5 100 0.638 0.638 0.159 1.28 2.5 2.5 0.625 5 50 1.28 1.28 0.159 2.55 5 5 0.625 10 12.5 1.28 5.1 0.159 10.2 5 20 0.625 40 6.25 1.28 5.1 0.159 10.2 5 20 0.625 40 1.56 1.28 5.1 0.159 10.2 5 20 0.625 40 table 132. pulse_ltcy register pls_ltcy[7:0] 8?b00000000 table 133. pulse_ltcy bit description field description pls_ltcy[7:0] pls_ltcy [7:0] defines the time interval that starts after the fi rst pulse detection where the pulse-detection function ignores the start of a new pulse. table 134. time step for pulse_ltcy with hp_filter_cutoff[ pls_hpf_en ] = 1 odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5 400 1.276 1.276 1.276 1.276 5 5 5 5 200 2.56 2.56 1.276 2.56 10 10 5 10 100 5.1 5.1 1.276 5.1 20 20 5 20 50 10.2 10.2 1.276 10.2 40 40 5 40 12.5 10.2 40.8 1.276 40.8 40 160 5 160 6.25 10.2 40.8 1.276 81.6 40 160 5 320 1.56 10.2 40.8 1.276 81.6 40 160 5 320
FXLS8471Q sensors freescale semiconductor, inc. 65 10.11.8 pulse_wind (0x28) register the time step for the pulse-window counter varies wi th the selected odr and power modes as defined in tables 138 and 139 . the maximum time value is equal to (time step @ odr and power mode) x 255. table 135. time step for pulse_ltcy with hp_filter_cutoff[ pls_hpf_en ] = 0 odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.318 0.318 0.318 0.318 1.25 1.25 1.25 1.25 400 0.318 0.318 0.318 0.638 1.25 1.25 1.25 2.5 200 0.638 0.638 0.318 1.276 2.5 2.5 1.25 5 100 1.276 1.276 0.318 2.56 5 5 1.25 10 50 2.56 2.56 0.318 5.1 10 10 1.25 20 12.5 2.56 10.2 0.318 20.4 10 40 1.25 80 6.25 2.56 10.2 0.318 20.4 10 40 1.25 80 1.56 2.56 10.2 0.318 20.4 10 40 1.25 80 table 136. pulse_wind register pls_wind[7:0] 8?b00000000 table 137. pulse_wind bit description field description pls_wind[7:0] pls_wind [7:0] defines the maximum interval of time that can elapse after the end of the latency interval in which the start of the second pulse event must be detected provided the device has been configured for double pulse detection. the detected second pulse width must be shorter than the time limit constraint specified by the pulse_tmlt register, but the end of the double pulse need not finish within the time specified by the pulse_wind register. table 138. time step for pul se_wind with hp _filter_cutoff[ pls_hpf_en ] = 1 odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.638 0.638 0.638 0.638 2.5 2.5 2.5 2.5 400 1.276 1.276 1.276 1.276 5 5 5 5 200 2.56 2.56 1.276 2.56 10 10 5 10 100 5.1 5.1 1.276 5.1 20 20 5 20 50 10.2 10.2 1.276 10.2 40 40 5 40 12.5 10.2 40.8 1.276 40.8 40 160 5 160 6.25 10.2 40.8 1.276 81.6 40 160 5 320 1.56 10.2 40.8 1.276 81.6 40 160 5 320
FXLS8471Q sensors 66 freescale semiconductor, inc. 10.12 offset correction the 8-bit 2?s complement offset correction r egisters are used to remove the sensor zero g offset on the x, y, and z axes after device board mount. the resolution of the offset registers is 2 mg per lsb, with an effective of fset adjustment range of -256 m g to +254 mg for each axis. for more information on how to calibrate the 0 g offset, please refer to freescale application note an4069. 10.12.1 off_x (0x2f) register 10.12.2 off_y (0x30) register 10.12.3 off_z (0x31) register table 139. time step for pul se_wind with hp _filter_cutoff[ pls_hpf_en ] = 0 odr (hz) max time range (s) time step (ms) normal lpln high resolution low power normal lpln high resolution low power 800 0.318 0.318 0.318 0.318 1.25 1.25 1.25 1.25 400 0.318 0.318 0.318 0.638 1.25 1.25 1.25 2.5 200 0.638 0.638 0.318 1.276 2.5 2.5 1.25 5 100 1.276 1.276 0.318 2.56 5 5 1.25 10 50 2.56 2.56 0.318 5.1 10 10 1.25 20 12.5 2.56 10.2 0.318 20.4 10 40 1.25 80 6.25 2.56 10.2 0.318 20.4 10 40 1.25 80 1.56 2.56 10.2 0.318 20.4 10 40 1.25 80 table 140. off_x register off_x[7:0] 8?b00000000 table 141. off_x bit description field description off_x[7:0] x-axis offset correction value ex pressed as an 8-bit 2's complement number. table 142. off_y register off_y[7:0] 8?b00000000 table 143. off_y bit description field description off_y[7:0] y-axis offset correction value expressed as an 8-bit 2's complement number. table 144. off_z register off_z[7:0] 8?b00000000 table 145. off_z bit description field description off_z[7:0] z-axis offset correction value ex pressed as an 8-bit 2's complement number.
FXLS8471Q sensors freescale semiconductor, inc. 67 11 mounting guidelines for the quad flat no-lead (qfn) package printed circuit board (pcb) layout is a cr itical portion of the total design. the footprint for the surface mount packages must be the correct size to ensure proper solder connection interface be tween the pcb and the package. with the correct footprint, the packages will self-align when subjected to a solder reflow process. these guidelines are for soldering and mount ing the quad flat no-lead (qfn) package inertial sensors to pcbs. the purpose is to minimize the stress on the package after board mounting . the FXLS8471Q uses the qfn package platform. this section describes suggested methods of soldering these devices to the pcb for consumer applications. freescale application note an1902, ?quad flat pack no-lead (q fn) micro dual flat pack no-lead (dfn)? discusses the qfn package used by the FXLS8471Q, pcb design guidelines for using qf n packages and temperature profiles for reflow soldering. 11.1 overview of soldering considerations information provided here is based on experim ents executed on qfn devices. as they c annot represent exact conditions present at a customer site, the information provided herein should be used for guidance only and further process and design optimizatio ns are recommended to develop an application specific solution. it shou ld be noted that with the proper pcb footprint and solder stencil designs, the package will self-align during the solder reflow process. 11.2 halogen content this package is designed to be halogen free, exceeding most industry and customer standar ds. halogen free means that no homogeneous material within the assembled package will contain ch lorine (cl) in excess of 700 ppm or 0.07% weight/weight or bromine (br) in excess of 900 ppm or 0.09% weight/weight. 11.3 pcb mounting recommendations 1. the pcb land should be designed with non-solder mask defined (nsmd) as shown in figure 18 and figure 19 . 2. no additional via pattern underneath package. 3. pcb land pad is 0.8 mm by 0.3 mm as shown in figure 18 and figure 19 . 4. solder mask opening = pcb land pad edge + 0.113 mm larger all around. 5. stencil opening = pcb land pad -0.015 mm smaller all around = 0.77 mm by 0.27 mm. 6. stencil thickness is 100 or 125 m. 7. do not place any components or vias at a distance le ss than 2 mm from the package land area. this may cause additional package stress if it is too close to the package land area. 8. signal traces connected to pads should be as symmetric as possible. put dummy traces on the nc pads in order to have same length of exposed trace for all pads. 9. use a standard pick and place process and equipment. do not use a hand soldering process. 10. do not use a screw down or stacking to fix the pcb into an enclosure as this could bend the pcb, putting stress on the package. 11. the pcb should be rated for the multiple lead- free reflow condition with max 260c temperature. 12. no copper traces on top layer of pcb under the package. this will cause planarity issues with board mount. freescale qfn sensors are compliant with restrictions on haza rdous substances (rohs), having halide-free molding compound (green) and lead-free terminations. these terminations are compatible with tin-lead (sn-pb) as well as tin- silver-copper (sn-ag-cu) solder paste so ldering processes. reflow profiles applic able to those processes can be used successfully for soldering the devices.
FXLS8471Q sensors 68 freescale semiconductor, inc. figure 18. recommended pcb land pattern, solder mask, and stencil opening near package footprint figure 19. detailed dimensions package footprint 0.467mm x 0.25mm package footprint pcblandpattern&stencil stencil opening = pcb land pad -0.015mm smaller all around = 0.77mm x 0.27mm solder mask opening = pcb land pad edge + 0.113mm larger all around pcb land pad = 0.8mm x 0.3mm 0.567 mm x 0.25 mm no copper in this area
FXLS8471Q sensors freescale semiconductor, inc. 69 12 package thermal characteristics table 146. thermal resistance data rating description symbol value unit junction-to-ambient, natural convection (1)(2) 1. junction temperature is a function of di e size, on-chip power dissipation, package t hermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2. per jedec jesd51-2 with the singl e-layer board (jesd51-3) horizontal. single-layer board r ja 163 c/w junction-to-ambient, natural convection (1)(3) 3. per jedec jesd51-6 with the board (jesd51-7) horizontal. four-layer board (two signals, two planes) 70 junction-to-board (4) 4. thermal resistance between the die and the printed circuit board per jedec jesd51-8. board temperature is measured on the top surface of the board near the package. r jb 33 c/w junction-to-case (top) (5) 5. thermal resistance between the die and the case top surface as measured by the cold plate method (mil spec-883 method 1012.1) . r jctop 84 c/w junction-to-package (top) (6) 6. thermal characterization parameter indicating the temperatur e difference between package top and the junction temperature per jedec jesd51-2. when greek letters are not available, the ther mal characterization parameter is written as psi-jt. natural convection jt 6 c / w
FXLS8471Q sensors 70 freescale semiconductor, inc. 13 package this drawing is located at http://cache.freescale.com/files/sh ared/doc/package_info/98asa00063d.pdf . case 2077-02 issue a 16-lead qfn a b d e f g
FXLS8471Q sensors freescale semiconductor, inc. 71 case 2077-02 issue a 16-lead qfn c c1
FXLS8471Q sensors 72 freescale semiconductor, inc. case 2077-02 issue a 16-lead qfn table 147. package dimensions (mm) symbol description min typ max a package width 2.9 3 3.1 b package length 2.9 3 3.1 c package thickness 0.9 0.98 1 c1 lead finger (pad) seating height 0 ? 0.05 d lead finger (pad) width 0.18 0.25 0.30 e lead length 0.367 0.467 0.567 f lead finger-finger (pad-pad) pitch ? 0.5 ? g package edge to inner edge of lead 0.467 0.567 0.667
FXLS8471Q sensors freescale semiconductor, inc. 73 appendix a a.1 errata a.1.1 spi mode soft-reset using ctrl_reg2 (0x2b), bit 6 description: following a soft-reset command, issued by setting ctrl_reg2[ rst ] = 1, certain device-specific parameters do not get updated correctly from nvm, causing inaccurate data output and incorrect whoami (0x0d) register content. this behavior happens only in spi mode. in i 2 c mode the device works as advertised. workaround: avoid using soft-reset in spi mode by al ternately utilizing t he hardware reset pin.
FXLS8471Q sensors 74 freescale semiconductor, inc. 14 revision history table 148. revision history revision number revision date description of changes 1.0 8/2013 ? initial data sheet. 1.1 8/2013 ? global update: ?counts/g? changed to ?lsb/g? throughout document. ? table 2: updated min values for self-test output change, x, y, and z from +249, +335, and +1680 to +192, +270, and +1275 respectively. ? appendix a.1.1: corrected register name in description paragraph. 1.2 11/2014 ? added ordering information table on page 2. 1.3 01/2015 ? added callouts to the package drawing and dim ension table following package drawing. 1.4 03/2015 ? table 147: added typ dimens ions for symbol c and e. 1.5 06/2015 ? added g callout to package drawing and dim ension table following package drawing.
document number: FXLS8471Q rev. 1.5 06/2015 information in this document is provided solely to enable system and software implementers to use freescale products. there are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based on the information in this document. freescale reserves the right to make changes without further notice to any products herein. freescale makes no warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does freescale assume any liability arising out of the app lication or use of an y product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. ?typical? parameters that may be provided in freescale data sheets and/or specifications can and do vary in differen t applications, and actual performance may vary over time. all operating parameters, including ?typicals,? must be validated for each customer application by customer?s technica l experts. freescale does not convey any license under its patent rights nor the rights of others. freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/salestermsandconditions . how to reach us: home page: freescale.com web support: freescale.com/support freescale, the freescale logo, and the energy efficient solutions logo are trademarks of freescale semiconductor, inc., reg. u.s. pat. & tm. off. all other product or service names are the property of their respective owners. ? 2013-2015 freescale semiconductor, inc.

▲Up To Search▲

Price & Availability of FXLS8471Q

	To Download FXLS8471Q Datasheet File
If you can't view the Datasheet, Please click here to try to view without PDF Reader .