1. product profile 1.1 general description a 200 w ldmos rf power transistor for broadca st transmitter applications and industrial applications. the transistor can deliver 200 w in broadband applications from hf to 860 mhz. the excellent ruggedness and broadband performance of this device makes it ideal for digital tran smitter applications. [1] par of output signal at 0.01% probability on ccdf; pa r of input signal = 9.5 db at 0.01% probability on ccdf. 1.2 features and benefits ? integrated esd protection ? excellent ruggedness ? high power gain ? high efficiency ? excellent reliability ? easy power control ? compliant to directive 2002/ 95/ec, regarding restricti on of hazardous substances (rohs) 1.3 applications ? transmitter applications in the hf to 860 mhz frequency range ? industrial applications in the hf to 860 mhz frequency range ? broadcast transmitters blf882; blf882s uhf power ldmos transistor rev. 2 ? 3 july 2015 product data sheet table 1. test information rf performance at t case =25 ? c in a class-ab test circuit. test signal f v ds p l(av) g p ? d par (mhz) (v) (w) (db) (%) (db) rf performance in a class-ab 705 mhz narrowband test circuit cw, class-ab 705 50 180 21 62 - cw pulsed, class-ab 705 50 200 21 63 - rf performance in a class-ab 470 mhz to 705 mhz broadband test circuit dvb-t (8k ofdm) 470 to 705 50 33 20 28 to 31 8.0 to 8.4 [1]
blf882_blf882s all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2015. all rig hts reserved. product data sheet rev. 2 ? 3 july 2015 2 of 12 nxp semiconductors blf882; blf882s uhf power ldmos transistor 2. pinning information [1] connected to flange. 3. ordering information 4. limiting values [1] continuous use at maximum temperature will affect the reliability, for details refer to the on-line mtf calculator. 5. thermal characteristics [1] r th(j-c) is measured under rf conditions. table 2. pinning pin description simplified outline graphic symbol blf882 (sot502a) 1drain 2gate 3source [1] blf882s (sot502b) 1drain 2gate 3source [1] v \ p v \ p table 3. ordering information type number package name description version blf882 - flanged ceramic package; 2 mounting holes; 2 leads sot502a blf882s - earless flanged ceramic package; 2 leads sot502b table 4. limiting values in accordance with the absolute maximum rating system (iec 60134). symbol parameter conditions min max unit v ds drain-source voltage - 104 v v gs gate-source voltage ? 0.5 +13 v t stg storage temperature ? 65 +150 ?c t j junction temperature [1] - 225 ?c table 5. thermal characteristics symbol parameter conditions typ unit r th(j-c) thermal resistance from junction to case t case =85 ?c; p l = 180 w [1] 0.56 k/w
blf882_blf882s all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2015. all rig hts reserved. product data sheet rev. 2 ? 3 july 2015 3 of 12 nxp semiconductors blf882; blf882s uhf power ldmos transistor 6. characteristics [1] i d is the drain current 7. test information 7.1 ruggedness in class-ab operation the blf882 and blf882s are capable of withstanding a load mismatch corresponding to vswr ? 20 : 1 through all phases under the following conditions: v ds =50v; f = 705 mhz at rated p l(1db) . table 6. dc characteristics t j = 25 ? c; unless otherwise specified. symbol parameter conditions min typ max unit v (br)dss drain-source breakdown voltage v gs =0v; i d =1.2ma [1] 104 - - v v gs(th) gate-source threshold voltage v ds = 10 v; i d =120ma [1] 1.4 1.9 2.4 v i dss drain leakage current v gs =0v; v ds =50v - - 1.4 ? a i dsx drain cut-off current v gs =v gs(th) + 3.75 v; v ds =10v [1] -19-a i gss gate leakage current v gs =10v; v ds = 0 v - - 140 na r ds(on) drain-source on-state resistance v gs =v gs(th) + 3.75 v; i d =4.25a [1] - 240 - m ? table 7. ac characteristics t j = 25 ? c; unless otherwise specified. symbol parameter conditions min typ max unit c iss input capacitance v gs =0v; v ds =50v; f=1mhz - 105 - pf c oss output capacitance v gs =0v; v ds =50v; f=1mhz - 34 - pf c rs feedback capacitance v gs =0v; v ds =50v; f=1mhz - 0.7 - pf table 8. rf characteristics test signal: cw pulsed; rf characteristics in nxp production narrowband test circuit; t j =25 ? c; unless otherwise specified. symbol parameter conditions min typ max unit v ds drain-source voltage - 50 - v i dq quiescent drain current - 100 - ma p l(av) average output power f = 705 mhz; t p =100 ? s; ? = 10 % 196 200 - w g p power gain 19.6 20.6 - db ? d drain efficiency 60 63 - %
blf882_blf882s all information provided in this document is subject to legal disclaimers. ? nxp semiconductors n.v. 2015. all rig hts reserved. product data sheet rev. 2 ? 3 july 2015 4 of 12 nxp semiconductors blf882; blf882s uhf power ldmos transistor 7.2 test circuit [1] american technica l ceramics type 100b. [2] american technica l ceramics type 800a. [3] american technica l ceramics type 800b. printed-circuit board (pcb): taconic rf-35; ? r = 3.5 f/m; thickness = 0.765 mm; thickness copper plating = 35 ? m, gold plated. see table 9 for a list of components. fig 1. component layout for class-ab production test circuit table 9. list of components for test circuit see figure 1 . component description value remarks c1 multilayer ceramic chip capacitor 62 pf [1] c2 multilayer ceramic chip capacitor 100 nf c3, c9 multilayer ceramic chip capacitor 56 pf [1] c4 multilayer ceramic chip capacitor 12 pf [2] c5 multilayer ceramic chip capacitor 11 pf [2] c6, c7 multilayer ceramic chip capacitor 24 pf [2] c8 electrolytic capacitor 220 ? f c10, c11, c12 electrolytic capacitor 750 pf [1] c13 multilayer ceramic chip capacitor 16 pf [3] c14 multilayer ceramic chip capacitor 18 pf [3] c15 multilayer ceramic chip capacitor 5.6 pf [3] c16 multilayer ceramic chip capacitor 6.8 pf [3] c17 multilayer ceramic chip capacitor 56 pf [3] l1, l2, l3 3 turn 1 mm spiral coil d = 3.0 mm; 120 nh r1, r2 resistor 10 ? smd 1206 r3 resistor 15 ? smd 1206 d d d p p p p & |