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  november 2013 ?2013 fairchild semiconductor corporation FDMC86261P rev.c1 www.fairchildsemi.com 1 FDMC86261P p-channel powertrench ? mosfet s s s g d d d d bottom d d d d s s s g top pin 1 mlp 3.3x3.3 FDMC86261P p-channel powertrench ? mosfet -150 v, -9 a, 160 m features ? max r ds(on) = 160 m at v gs = -10 v, i d = -2.4 a ? max r ds(on) = 185 m at v gs = -6 v, i d = -2.2 a ? very low rds-on mid voltage p channel silicon technology optimised for low qg ? this product is optimised for fa st switching applications as well as load switch applications ? 100% uil tested ? rohs compliant general description this p-channel mosfet is produced using fairchild semiconductor?s advanced powertrench ? technology. this very high density process is es pecially tailored to minimize on-state resistance and optimi zed for superior switching performance. applications ? active clamp switch ? load switch mosfet maximum ratings t a = 25 c unless otherwise noted thermal characteristics package marking and ordering information symbol paramete r ratings units v ds drain to source voltage -150 v v gs gate to source voltage 25 v i d drain current -continuous t c = 25 c -9 a -continuous t a = 25 c (note 1a) -2.7 -pulsed -20 e as single pulse avalanche energy (note 3) 121 mj p d power dissipation t c = 25 c 40 w power dissipation t a = 25 c (note 1a) 2.3 t j , t stg operating and storage junction temperature range -55 to + 150 c r jc thermal resistance, junction to case 3.1 c/w r ja thermal resistance, junction to ambient (note 1a) 53 device marking device package reel size tape width quantity FDMC86261P FDMC86261P power 33 13?? 12 mm 3000 units
www.fairchildsemi.com 2 ?2013 fairchild semiconductor corporation FDMC86261P rev.c1 FDMC86261P p-channel powertrench ? mosfet electrical characteristics t j = 25 c unless otherwise noted off characteristics on characteristics dynamic characteristics switching characteristics drain-source diode characteristics symbol parameter test conditions min typ max units bv dss drain to source breakdown voltage i d = -250 a, v gs = 0 v -150 v bv dss t j breakdown voltage temperature coefficient i d = -250 a, referenced to 25 c -132 mv/c i dss zero gate voltage drain current v ds = -120 v, v gs = 0 v -1 a i gss gate to source leakage current v gs = 25 v, v ds = 0 v 100 na v gs(th) gate to source threshold voltage v gs = v ds , i d = -250 a-2-3-4v v gs(th) t j gate to source threshold voltage temperature coefficient i d = -250 a, referenced to 25 c 6 mv/c r ds(on) static drain to source on resistance v gs = -10 v, i d = -2.4 a 130 160 m v gs = -6 v, i d = -2.2 a 141 185 v gs = -10 v, i d = -2.4 a,t j = 125 c 218 269 g fs forward transconductance v ds = -10 v, i d = -2.4 a 9 s c iss input capacitance v ds = -75 v, v gs = 0 v, f = 1 mhz 1021 1360 pf c oss output capacitance 87 120 pf c rss reverse transfer capacitance 4.7 10 pf r g gate resistance 0.1 1.7 3.4 t d(on) turn-on delay time v dd = -75 v, i d = -2.4 a, v gs = -10 v, r gen = 6 11 20 ns t r rise time 2.4 10 ns t d(off) turn-off delay time 18 33 ns t f fall time 9.2 20 ns q g(tot) total gate charge v gs = 0 v to -10 v v dd = -75 v, i d = -2.4 a 17 24 nc q g(tot) total gate charge v gs = 0 v to -6 v 11 16 nc q gs total gate charge 4.2 nc q gd gate to drain ?miller? charge 3.7 nc v sd source to drain diode forward voltage v gs = 0 v, i s = -2.4 a (note 2) -0.81 -1.3 v v gs = 0 v, i s = -1.9 a (note 2) -0.80 -1.2 v t rr reverse recovery time i f = -2.4 a, di/dt = 100 a/ s 81 130 ns q rr reverse recovery charge 197 315 nc notes: 1. r ja is determined with the device mounted on a 1 in 2 pad 2 oz copper pad on a 1.5 x 1.5 in. board of fr-4 material. r jc is guaranteed by design while r ca is determined by the user's board design. 2. pulse test: pulse width < 300 s, duty cycle < 2.0%. 3. starting t j = 25 c; p-ch: l = 3 mh, i as = -9 a, v dd = -150 v, v gs = -10 v. 100% test at l = 0.1 mh, i as = -28 a. a) 53 c/w when mounted on a 1 in 2 p a d o f 2 o z c o p p e r b) 125 c/w when mounted on a minimum pad of 2 oz copper g df ds sf ss g df ds sf ss
www.fairchildsemi.com 3 ?2013 fairchild semiconductor corporation FDMC86261P rev.c1 FDMC86261P p-channel powertrench ? mosfet typical characteristics t j = 25 c unless otherwise noted figure 1. 012345 0 5 10 15 20 v gs = -5.5 v v gs = -5 v v gs = -6 v pulse duration = 80 p s duty cycle = 0.5% max v gs = -4.5 v v gs = -10 v -i d , drain current (a) -v ds , drain to source voltage (v) on region characteristics figure 2. 0 5 10 15 20 0 1 2 3 4 v gs = -5 v pulse duration = 80 p s duty cycle = 0.5% max normalized drain to source on-resistance -i d , drain current (a) v gs = -5.5 v v gs = -6 v v gs = -4.5 v v gs = -10v n o r m a l i z e d o n - r e s i s t a n c e vs drain current and gate voltage f i g u r e 3 . n o r m a l i z e d o n r e s i s t a n c e -75 -50 -25 0 25 50 75 100 125 150 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 i d = -2.4 a v gs = -10v normalized drain to source on-resistance t j , junction temperature ( o c ) vs junction temperature figure 4. 45678910 0 100 200 300 400 500 t j = 125 o c i d = -2.4 a t j = 25 o c -v gs , gate to source voltage (v) r ds(on) , drain to source on-resistance ( m : ) pulse duration = 80 p s duty cycle = 0.5% max o n - r e s i s t a n c e v s g a t e t o source voltage figure 5. transfer characteristics 23456 0 5 10 15 20 t j = 150 o c v ds = -10 v pulse duration = 80 p s duty cycle = 0.5% max t j = -55 o c t j = 25 o c -i d , drain current (a) -v gs , gate to source voltage (v) figure 6. 0.0 0.2 0.4 0.6 0.8 1.0 1.2 0.001 0.01 0.1 1 10 100 t j = -55 o c t j = 25 o c t j = 150 o c v gs = 0 v -i s , reverse drain current (a) -v sd , body diode forward voltage (v) s o u r c e t o d r a i n d i o d e forward voltage vs source current
www.fairchildsemi.com 4 ?2013 fairchild semiconductor corporation FDMC86261P rev.c1 FDMC86261P p-channel powertrench ? mosfet figure 7. 048121620 0 2 4 6 8 10 i d = -2.4 a v dd = -100 v v dd = -50 v -v gs , gate to source voltage (v) q g , gate charge (nc) v dd = -75 v gate charge characteristics figure 8. 0.1 1 10 100 1 10 100 1000 10000 f = 1 mhz v gs = 0 v capacitance (pf) -v ds , drain to source voltage (v) c rss c oss c iss c a p a c i t a n c e v s d r a i n to source voltage figure 9. 0.001 0.01 0.1 1 10 20 1 10 50 t j = 125 o c t j = 25 o c t j = 100 o c t av , time in avalanche (ms) -i as , avalanche current (a) u n c l a m p e d i n d u c t i v e switching capability figure 10. 25 50 75 100 125 150 0 3 6 9 12 v gs = -6 v limited by package r t jc = 3.1 o c/w v gs = -10 v -i d , drain current (a) t c , case temperature ( o c ) m a x i m u m c o n t i n u o u s d r a i n current vs case temperature fi g ure 11 . fo rw ard bi as safe op erating area 0.1 1 10 100 500 0.005 0.01 0.1 1 10 30 1 s curve bent to measured data 100 p s 10 ms dc 10 s 100 ms 1 ms -i d , drain current (a) -v ds , drain to source voltage (v) this area is limited by r ds(on) single pulse t j = max rated r t ja = 125 o c/w t a = 25 o c f i g u r e 1 2 . s i n g l e p u l s e m a x i m u m power dissipation 10 -4 10 -3 10 -2 10 -1 110 100 1000 0.5 1 10 100 1000 single pulse r t ja = 125 o c/w t a = 25 o c p ( pk ) , peak transient power (w) t, pulse width (sec) typical characteristics t j = 25 c unless otherwise noted
www.fairchildsemi.com 5 ?2013 fairchild semiconductor corporation FDMC86261P rev.c1 FDMC86261P p-channel powertrench ? mosfet figure 13. 10 -4 10 -3 10 -2 10 -1 11 0 100 1000 0.001 0.01 0.1 1 2 single pulse duty cycle-descending order r(t), normalized effective transient thermal resistance t, rectangular pulse duration (sec) d = 0.5 0.2 0.1 0.05 0.02 0.01 p dm t 1 t 2 notes: z t ja (t) = r(t) x r t ja r t ja = 125 o c/w duty cycle, d = t 1 / t 2 peak t j = p dm x z t ja (t) + t a junction-to-ambient transient thermal response curve typical characteristics t j = 25 c unless otherwise noted
www.fairchildsemi.com 6 ?2013 fairchild semiconductor corporation FDMC86261P rev.c1 FDMC86261P p-channel powertrench ? mosfet dimensional outline and pad layout b. dimensions are in millimeters. c. dimensions and tolerances per a. does not conform to jedec registration mo-229 asme y14.5m, 1994 0. 10 cab 0. 05 c top view bottom view recommended land pattern 0.10 c 0. 08 c b a 3.30+0.10 3.30+0.10 0.05 0.00 0. 10 c 2x 2x 0.8 max side view seating plane 0.10 c pin #1 ident (0.20) 8 5 1.95 0.65 e. drawing file name : mkt-mlp08srev2 pin#1 quadrant 0.35+0.05 4 1 (8x) d. land pattern recommendation is based on fsc design only 2.27+0.05 0.50+0.05 (4x) (1.15) 0.30+0.05 2.00 +0.05 (0.35) r0.15 (0.79) f. fairchild semiconductor (3x) keep out area (3.40) 2.37 0.45(4x) (1.70) 2.152 (0.648) 0.42(8x) 0.70(4x) 0.65 1.95 (0.402) 4 1 85
FDMC86261P p-channel powertrench ? mosfet ?2013 fairchild semiconductor corporation 7 www.fairchildsemi.com FDMC86261P rev.c1 trademarks the following includes registered and unregistered trademarks and service marks, owned by fairch ild semiconductor and/or its gl obal subsidiaries, and is not intended to be an exhaustive list of all such trademarks. *trademarks of system general corporation, used under license by fairchild semiconductor. disclaimer fairchild semiconductor reserves the right to make changes with out further notice to any products herein to improve reliability, function, or design. fairchild does not assume an y liability arising out of th e application or use of any product or circuit described herein; neither does it convey an y license under its patent rights, nor the rights of others. these specifications do not expand the terms of fairchild?s wo rldwide terms and conditions , specifically the warranty therein, which covers these products. life support policy fairchild?s products are not authorized for use as critica l components in life support devices or systems without the express written approval of fairchild semiconductor corporation. as used here in: 1. life support devices or systems ar e devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a sign ificant injury of the user. 2. a critical component in any com ponent of a life support, device, or system whose failure to perform can be reasonably ex pected to cause the failure of the life support device or system, or to affect its safety or effectiveness. product status definitions definition of terms accupower? ax-cap ? * bitsic? build it now? coreplus? corepower? crossvolt ? ctl? current transfer logic? deuxpeed ? dual cool? ecospark ? efficentmax? esbc? fairchild ? fairchild semiconductor ? fact quiet series? fact ? fast ? fastvcore? fetbench? fps? f-pfs? frfet ? global power resource sm greenbridge? green fps? green fps? e-series? g max ? gto? intellimax? isoplanar? marking small speakers sound louder and better? megabuck? microcoupler? microfet? micropak? micropak2? millerdrive? motionmax? mwsaver ? optohit? optologic ? optoplanar ? powertrench ? powerxs? programmable active droop? qfet ? qs? quiet series? rapidconfigure? saving our world, 1mw/w/kw at a time? signalwise? smartmax? smart start? solutions for your success? spm ? stealth? superfet ? supersot?-3 supersot?-6 supersot?-8 supremos ? syncfet? sync-lock? ?* tinyboost ? tinybuck ? tinycalc? tinylogic ? tinyopto? tinypower? tinypwm? tinywire? transic? trifault detect? truecurrent ? * serdes? uhc ? ultra frfet? unifet? vcx? visualmax? voltageplus? xs? ? ? datasheet identification product status definition advance information for mative / in design datasheet contains the design specifications for product development. specifications may change in any manner without notice. preliminary first production datasheet contains preliminary data; supplementary data will be published at a later date. fairchild semiconductor reserves the ri ght to make changes at any time without notice to improve design. no identification needed full production datasheet contains final specifications. fair child semiconductor re serves the right to make changes at any time without notice to improve the design. obsolete not in production datasheet contains specifications on a product t hat is discontinued by fairchild semiconductor. the datasheet is for reference information only. anti-counterfeiting policy fairchild semiconductor corporation?s anti-c ounterfeiting policy. fairchild?s anti-count erfeiting policy is also stated on our external website, www.fairchildsemi.com, under sales support . counterfeiting of semiconductor parts is a growing problem in the industry. all manuf actures of semiconductor products are expe riencing counterfeiting of their parts. customers who inadv ertently purchase counterfeit parts experience many problems such as loss of brand reputation, substa ndard performance, failed application, and increased cost of producti on and manufacturing delays. fairchild is taki ng strong measures to protect ourselve s and our customers from the proliferation of counterfeit parts. fairchild strongly encourages customers to purchase fairchild parts either directly from fa irchild or from authorized fairchild distributors who are listed by country on our web page cited above. product s customers buy either from fairchild directly or fr om authorized fairchild distributors are genuine parts, have full traceability, meet fairchild?s quality standards for handing and storage and provide access to fairchild?s full range of up-to-date technical and product information. fairchild and our authorized distributors will stand behind all warranties and wi ll appropriately address and warranty issues that may arise. fairchil d will not provide any warranty coverage or other assistance for pa rts bought from unau thorized sources. fairchild is committed to combat this global problem and encourage our customer s to do their part in stopping th is practice by buying direct or from authorized distributors. rev. i66 tm ?
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