| PART |
Description |
Maker |
| 50PMA-019 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
| ARF2496K |
2.4GHz RF Single Chip Transceiver FCC/ETSI Radiation Test Report
|
Alfa plus
|
| 28229-PCN-001-A 28973-DSH-001-A-15 |
Test and Ship Location Change for CX28224/5/9 Inverse Multiplexing
Single-Chip SDSL/HDSL Transceiver
|
M/A-COM Technology Solutions, Inc.
M/A-COM Technology Solution...
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 4082A |
Parametric Test System
|
Keysight Technologies
|
| MC74LCX646DW MC74LCX646 ON1572 MC74LCX646DT MC74LC |
LOW-VOLTAGE CMOS OCTAL TRANSCEIVER/ REGISTERED TRANSCEIVER
From old datasheet system
|
ONSEMI[ON Semiconductor]
MOTOROLA[Motorola Inc]
MOTOROLA[Motorola, Inc]
|
| 4082F |
Flash Memory Cell Parametric Test System
|
Keysight Technologies
|
| MC34055DW MC34055 ON1085 |
10BASE-T TRANSCEIVER
10BAS-T TRANSCEIVER
From old datasheet system
|
Motorola, Inc
ON Semi
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| DK-21192 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| DK-14753 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
