| PART |
Description |
Maker |
| 50PMA-015 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 28229-PCN-001-A 28973-DSH-001-A-15 |
Test and Ship Location Change for CX28224/5/9 Inverse Multiplexing
Single-Chip SDSL/HDSL Transceiver
|
M/A-COM Technology Solutions, Inc.
M/A-COM Technology Solution...
|
| IDT5991A-7JI IDT5991A IDT5991A-2JI IDT5991A-5JI ID |
Scan Test Devices With 18-Bit Universal Bus Transceiver 64-LQFP -40 to 85
PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| DTS-1600A |
Dielectric Test System
|
Directed Energy
|
| 50PA-560 |
HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| MC74LCX652 MC74LCX652DT MC74LCX652DW MC74LCX652SD |
LOW.VOLTAGE CMOS OCTAL TRANSCEIVER/ REGISTERED TRANSCEIVER WITH DUAL ENABLE LVC/LCX/Z SERIES, 8-BIT REGISTERED TRANSCEIVER, TRUE OUTPUT, PDSO24
From old datasheet system
LOW-VOLTAGE CMOS OCTAL TRANSCEIVER/ REGISTERED TRANSCEIVER WITH DUAL ENABLE
|
MOTOROLA[Motorola, Inc]
ONSEMI[ON Semiconductor]
|
| BA7024 A5800785 |
Video signal switcher with test pattern generator
From old datasheet system
|
ROHM
|
| 74LVC646A_3 74LVC646A 74LVC646APWDH |
LVC/LCX/Z SERIES, 8-BIT REGISTERED TRANSCEIVER, TRUE OUTPUT, PDSO24
From old datasheet system
Octal bus transceiver/register (3-State)
|
NXP SEMICONDUCTORS
Philips
|
| DK-20096 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| DK-2371 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
